Inventor
HE DONGMING
US19 patents
⚠️ This page may combine multiple inventors who share the name “HE DONGMING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
QUALCOMM INC
11 patentsUS8963339B2Feb 24, 2015
Stacked multi-chip integrated circuit package
QUALCOMM INC59 citations96
US9406649B2Aug 2, 2016
Stacked multi-chip integrated circuit package
QUALCOMM INC3 citations72
US12564107B2Feb 24, 2026
Package comprising optical integrated device
QUALCOMM INC0 citations62
US11417622B2Aug 16, 2022
Flip-chip device
QUALCOMM INC0 citations62
US12113038B2Oct 8, 2024
Thermal compression flip chip bump for high performance and fine pitch
QUALCOMM INC0 citations61
US11948909B2Apr 2, 2024
Package comprising spacers between integrated devices
QUALCOMM INC1 citations61
US11694982B2Jul 4, 2023
Sidewall wetting barrier for conductive pillars
QUALCOMM INC0 citations61
US11557557B2Jan 17, 2023
Flip-chip flexible under bump metallization size
QUALCOMM INC1 citations61
US11721656B2Aug 8, 2023
Integrated device comprising pillar interconnect with cavity
QUALCOMM INC0 citations58
US12500188B2Dec 16, 2025
Flip-chip bumping metal layer and bump structure
QUALCOMM INC0 citations51
US11437335B2Sep 6, 2022
Integrated circuit (IC) packages employing a thermal conductive package substrate with die region split, and related fabrication methods
QUALCOMM INC0 citations49
INTEL CORP
6 patentsUS7251389B2Jul 31, 2007
Embedded on-die laser source and optical interconnect
INTEL CORP46 citations92
US6989586B2Jan 24, 2006
Integrated circuit packages with reduced stress on die and associated substrates, assemblies, and systems
INTEL CORP27 citations90
US7517787B2Apr 14, 2009
C4 joint reliability
INTEL CORP8 citations81
US7626251B2Dec 1, 2009
Microelectronic die assembly having thermally conductive element at a backside thereof and method of making same
INTEL CORP2 citations63
US7465651B2Dec 16, 2008
Integrated circuit packages with reduced stress on die and associated methods
INTEL CORP1 citations50
US7656035B2Feb 2, 2010
C4 joint reliability
INTEL CORP0 citations49