Inventor
MINNE STEPHEN C
US30 patents
⚠️ This page may combine multiple inventors who share the name “MINNE STEPHEN C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
VEECO INSTR INC
9 patentsUS6672144B2Jan 6, 2004
Dynamic activation for an atomic force microscope and method of use thereof
VEECO INSTR INC58 citations96
US7036357B2May 2, 2006
Dynamic activation for an atomic force microscope and method of use thereof
VEECO INSTR INC17 citations92
US7017398B2Mar 28, 2006
Active probe for an atomic force microscope and method for use thereof
VEECO INSTR INC13 citations92
US6886395B2May 3, 2005
Method of fabricating a surface probing device and probing device produced thereby
VEECO INSTR INC28 citations92
US6810720B2Nov 2, 2004
Active probe for an atomic force microscope and method of use thereof
VEECO INSTR INC28 citations92
US7691661B2Apr 6, 2010
Method of fabricating a surface probing device
VEECO INSTR INC8 citations84
US7204131B2Apr 17, 2007
Dynamic activation for an atomic force microscope and method of use thereof
VEECO INSTR INC12 citations84
US6941823B1Sep 13, 2005
Apparatus and method to compensate for stress in a microcantilever
VEECO INSTR INC15 citations79
US6912893B2Jul 5, 2005
Apparatus and method for improving tuning of a probe-based instrument
VEECO INSTR INC6 citations58
UNIV LELAND STANFORD JUNIOR
8 patentsUS6028305AFeb 22, 2000
Dual cantilever scanning probe microscope
UNIV LELAND STANFORD JUNIOR103 citations98
US5618760AApr 8, 1997
Method of etching a pattern on a substrate using a scanning probe microscope
UNIV LELAND STANFORD JUNIOR100 citations98
US6770472B2Aug 3, 2004
Direct DNA sequencing with a transcription protein and a nanometer scale electrometer
UNIV LELAND STANFORD JUNIOR94 citations97
US5908981AJun 1, 1999
Interdigital deflection sensor for microcantilevers
UNIV LELAND STANFORD JUNIOR101 citations97
US5858256AJan 12, 1999
Method of forming small aperture
UNIV LELAND STANFORD JUNIOR19 citations93
US6156216ADec 5, 2000
Method for making nitride cantilevers devices
UNIV LELAND STANFORD JUNIOR27 citations92
US6002131ADec 14, 1999
Scanning probe potentiometer
UNIV LELAND STANFORD JUNIOR37 citations92
US6307202B1Oct 23, 2001
Bimorph spirals for uncooled photothermal spectroscopy
UNIV LELAND STANFORD JUNIOR12 citations73
NANODEVICES INC
4 patentsUS6189374B1Feb 20, 2001
Active probe for an atomic force microscope and method of use thereof
NANODEVICES INC96 citations98
US6530266B1Mar 11, 2003
Active probe for an atomic force microscope and method of use thereof
NANODEVICES INC75 citations97
US6196061B1Mar 6, 2001
AFM with referenced or differential height measurement
NANODEVICES INC108 citations97
US6279389B1Aug 28, 2001
AFM with referenced or differential height measurement
NANODEVICES INC57 citations95
BRUKER NANO INC
4 patentsUS9213047B2Dec 15, 2015
Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode
BRUKER NANO INC7 citations82
US8881311B2Nov 4, 2014
Method and apparatus of physical property measurement using a probe-based nano-localized light source
BRUKER NANO INC10 citations81
US9869694B2Jan 16, 2018
Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode
BRUKER NANO INC1 citations61
US9052336B2Jun 9, 2015
Method and apparatus of physical property measurement using a probe-based nano-localized light source
BRUKER NANO INC1 citations49