Inventor
YOKOTA TOSHIHIKO
JP7 patents
⚠️ This page may combine multiple inventors who share the name “YOKOTA TOSHIHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
6 patentsUS7752513B2Jul 6, 2010
Method and circuit for LSSD testing
IBM11 citations76
US7356797B2Apr 8, 2008
Logic transformation and gate placement to avoid routing congestion
IBM5 citations66
US7793183B2Sep 7, 2010
Microcomputer and method of testing the same
IBM2 citations59
US7752586B2Jul 6, 2010
Design structure of an integration circuit and test method of the integrated circuit
IBM2 citations59
US8006210B2Aug 23, 2011
Logic transformation and gate placement to avoid routing congestion
IBM0 citations45
US7930608B2Apr 19, 2011
Circuit for controlling voltage fluctuation in integrated circuit
IBM0 citations38