Inventor
HIRAIDE TAKAHISA
JP11 patents
⚠️ This page may combine multiple inventors who share the name “HIRAIDE TAKAHISA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJITSU LTD
7 patentsUS7178078B2Feb 13, 2007
Testing apparatus and testing method for an integrated circuit, and integrated circuit
FUJITSU LTD38 citations89
US7337379B2Feb 26, 2008
Apparatus and method for diagnosing integrated circuit
FUJITSU LTD17 citations82
US7266746B2Sep 4, 2007
Device and method for testing integrated circuit
FUJITSU LTD16 citations82
US5815513ASep 29, 1998
Test pattern preparation system
FUJITSU LTD19 citations82
US7895492B2Feb 22, 2011
Pseudorandom number generator, semiconductor integrated circuit, pseudorandom number generator control apparatus, pseudorandom number generator control method, and computer product
FUJITSU LTD4 citations60
US7757138B2Jul 13, 2010
Semiconductor integrated circuit, test data generating device, LSI test device, and computer product
FUJITSU LTD6 citations60
US7761761B2Jul 20, 2010
Semiconductor integrated circuit, test data generating device, LSI test device, and computer product
FUJITSU LTD1 citations50
HIRAIDE TAKAHISA
3 patentsUS8644093B2Feb 4, 2014
Writing circuit, semiconductor integrated circuit and writing method
HIRAIDE TAKAHISA1 citations48
US8166380B2Apr 24, 2012
Method and apparatus for identifying paths having appropriate lengths for fault simulation
HIRAIDE TAKAHISA0 citations48
US8081528B2Dec 20, 2011
Integrated circuit and method for testing the circuit
HIRAIDE TAKAHISA0 citations48