P

Inventor

DRIBINSKI VLADIMIR

US26 patents
⚠️ This page may combine multiple inventors who share the name “DRIBINSKI VLADIMIR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR CORP

21 patents
US8929406B2Jan 6, 2015

193NM laser and inspection system

KLA TENCOR CORP63 citations98
US9608399B2Mar 28, 2017

193 nm laser and an inspection system using a 193 nm laser

KLA TENCOR CORP21 citations94
US9529182B2Dec 27, 2016

193nm laser and inspection system

KLA TENCOR CORP33 citations94
US9459215B2Oct 4, 2016

Passivation of nonlinear optical crystals

KLA TENCOR CORP14 citations92
US11180866B2Nov 23, 2021

Passivation of nonlinear optical crystals

KLA TENCOR CORP7 citations84
US10283366B2May 7, 2019

Passivation of nonlinear optical crystals

KLA TENCOR CORP8 citations84
US9748729B2Aug 29, 2017

183NM laser and inspection system

KLA TENCOR CORP14 citations84
US9461435B2Oct 4, 2016

Alleviation of laser-induced damage in optical materials by suppression of transient color centers formation and control of phonon population

KLA TENCOR CORP13 citations84
US9318869B2Apr 19, 2016

193nm laser and inspection system

KLA TENCOR CORP11 citations84
US9059560B2Jun 16, 2015

Alleviation of laser-induced damage in optical materials by suppression of transient color centers formation and control of phonon population

KLA TENCOR CORP10 citations84
US10175555B2Jan 8, 2019

183 nm CW laser and inspection system

KLA TENCOR CORP12 citations83
US10199149B2Feb 5, 2019

183NM laser and inspection system

KLA TENCOR CORP2 citations73
US9972959B2May 15, 2018

Semiconductor inspection and metrology system using laser pulse multiplier

KLA TENCOR CORP2 citations73
US9419407B2Aug 16, 2016

Laser assembly and inspection system using monolithic bandwidth narrowing apparatus

KLA TENCOR CORP5 citations73
US9413134B2Aug 9, 2016

Multi-stage ramp-up annealing for frequency-conversion crystals

KLA TENCOR CORP3 citations73
US10429719B2Oct 1, 2019

183 nm CW laser and inspection system

KLA TENCOR CORP2 citations72
US9097683B2Aug 4, 2015

Laser with high quality, stable output beam, and long life high conversion efficiency non-linear crystal

KLA TENCOR CORP3 citations63
US11227770B2Jan 18, 2022

Passivation of nonlinear optical crystals

KLA TENCOR CORP0 citations62
US10439355B2Oct 8, 2019

193nm laser and inspection system

KLA TENCOR CORP0 citations52
US10193293B2Jan 29, 2019

Semiconductor inspection and metrology system using laser pulse multiplier

KLA TENCOR CORP0 citations52
US9935421B2Apr 3, 2018

193nm laser and inspection system

KLA TENCOR CORP0 citations52

DRIBINSKI VLADIMIR

2 patents

CHUANG YUNG-HO

2 patents

KLA CORP

1 patent