Inventor

OHTSUKA KENICHI

JP44 patents

⚠️ This page may combine multiple inventors who share the name “OHTSUKA KENICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OHTSUKA KENICHI

MITSUBISHI ELECTRIC CORP

Semiconductor laser device

Silicon carbide semiconductor device and method for manufacturing the same

MOSFET and method for manufacturing MOSFET

Semiconductor device

Semiconductor device and method for manufacturing the same

Nitride semiconductor device including an electrode in ohmic contact with a P-type nitride semiconductor contact layer

Semiconductor laser

Semiconductor device having junction termination extension

Silicon carbide semiconductor device

Method for manufacturing silicon carbide semiconductor device

Method of manufacturing semiconductor device including gallium-nitride semiconductor structure and a palladium contact

OHTSUKA KENICHI

Film thickness measurement device and film thickness measurement method

Power semiconductor device

Epitaxial wafer and semiconductor element

Silicon carbide epitaxial wafer and semiconductor device

Reflectivity measuring device, reflectivity measuring method, membrane thickness measuring device, and membrane thickness measuring method

Semiconductor device and method of fabricating same

Film thickness measurement device and measurement method

MIURA NARUHISA

Semiconductor device and method for manufacturing the same

Semiconductor device

Power semiconductor device

Semiconductor device

CYPRESS SEMICONDUCTOR CORP

Self-aligned trench isolation in integrated circuits

Self-aligned trench isolation in integrated circuits

Self-aligned trench isolation in integrated circuits

Integrating transistors with different poly-silicon heights on the same die

HAMAMATSU PHOTONICS KK

Film thickness measurement method and film thickness measurement device

Optical unit and film thickness measurement device

Film thickness measuring device and film thickness measuring method

Film thickness measurement device, film thickness measurement method, film thickness measurement program, and recording medium for recording film thickness measurement program

HINO SHIRO

Power semiconductor device and method for manufacturing same

Semiconductor device

WATANABE HIROSHI

Semiconductor device including a cell array having first cells and second cells interspersed around the arrangement of the first cells

Semiconductor device having a groove and a junction termination extension layer surrounding a guard ring layer

YAMAHA MOTOR CO LTD

Seat for watercraft

TARUI YOICHIRO

Silicon carbide semiconductor device

LIN CHUAN

Integrating transistors with different poly-silicon heights on the same die

CHAN SIMON SIU-SING

Method and manufacture for embedded flash to achieve high quality spacers for core and high voltage devices and low temperature spacers for high performance logic devices

SONY CORP

Side pincushion correction circuit

HAMANO KENICHI

Method for manufacturing silicon carbide semiconductor device

FURUKAWA AKIHIKO

Power semiconductor device

SUGINO RINJI

Patterned dummy wafers loading in batch type CVD

TOMITA NOBUYUKI

Method of manufacturing silicon carbide epitaxial wafer

MATSUNO YOSHINORI

Method for manufacturing silicon carbide semiconductor device