Inventor

NAKANO TETSUHISA

JP4 patents

⚠️ This page may combine multiple inventors who share the name “NAKANO TETSUHISA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OHTSUKA KENICHI

3 patents

US8885173B2Nov 11, 2014

Film thickness measurement device and film thickness measurement method

OHTSUKA KENICHI6 citations70

US8699023B2Apr 15, 2014

Reflectivity measuring device, reflectivity measuring method, membrane thickness measuring device, and membrane thickness measuring method

OHTSUKA KENICHI3 citations59

US8649023B2Feb 11, 2014

Film thickness measurement device and measurement method

OHTSUKA KENICHI1 citations49

HAMAMATSU PHOTONICS KK

1 patent

US9846028B2Dec 19, 2017

Film thickness measurement method and film thickness measurement device

HAMAMATSU PHOTONICS KK3 citations70