Inventor

WATANABE MOTOYUKI

JP10 patents

⚠️ This page may combine multiple inventors who share the name “WATANABE MOTOYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HAMAMATSU PHOTONICS KK

6 patents

US6897964B2May 24, 2005

Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them

HAMAMATSU PHOTONICS KK34 citations92

US6768552B2Jul 27, 2004

Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them

HAMAMATSU PHOTONICS KK20 citations83

US5250795AOct 5, 1993

Feeble light measuring device

HAMAMATSU PHOTONICS KK7 citations73

US5017829AMay 21, 1991

Framing camera

HAMAMATSU PHOTONICS KK6 citations62

US6897953B2May 24, 2005

Method for measuring fluorescence, apparatus for measuring fluorescence and apparatus for evaluating sample using it

HAMAMATSU PHOTONICS KK5 citations61

US4945224AJul 31, 1990

Optical waveform observing apparatus

HAMAMATSU PHOTONICS KK5 citations58

OHTSUKA KENICHI

2 patents

US8885173B2Nov 11, 2014

Film thickness measurement device and film thickness measurement method

OHTSUKA KENICHI6 citations70

US8649023B2Feb 11, 2014

Film thickness measurement device and measurement method

OHTSUKA KENICHI1 citations49

HAMANATSU PHOTONICS K K

1 patent

US7400396B2Jul 15, 2008

Fluorescent correalated spectrometric analysis device

HAMANATSU PHOTONICS K K7 citations68

WATANABE MOTOYUKI

1 patent

US8462337B2Jun 11, 2013

Spectrometer, spectrometry, and spectrometry program

WATANABE MOTOYUKI4 citations56