Inventor
FENG YE
CN35 patents
⚠️ This page may combine multiple inventors who share the name “FENG YE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SHENZHEN LADY MERRY TECH CO LTD
10 patentsUSD865287SOct 29, 2019
Hair straightener
SHENZHEN LADY MERRY TECH CO LTD19 citations93
USD821031SJun 19, 2018
Hairdressing apparatus
SHENZHEN LADY MERRY TECH CO LTD20 citations93
USD893098SAug 11, 2020
Hair straightener
SHENZHEN LADY MERRY TECH CO LTD3 citations72
USD836246SDec 18, 2018
Hairdressing apparatus
SHENZHEN LADY MERRY TECH CO LTD3 citations72
USD829989SOct 2, 2018
Hairdressing apparatus
SHENZHEN LADY MERRY TECH CO LTD5 citations72
US11571054B2Feb 7, 2023
Hair perming device and its temperature control circuit
SHENZHEN LADY MERRY TECH CO LTD0 citations62
US11250998B2Feb 15, 2022
Hair straightener and integrated switch for control and display
SHENZHEN LADY MERRY TECH CO LTD1 citations62
US10278469B2May 7, 2019
Hairdressing apparatus with anion function having switch, temperature regulation and display parts
SHENZHEN LADY MERRY TECH CO LTD1 citations62
US9999285B2Jun 19, 2018
Aluminum tube-coated novel hair curler
SHENZHEN LADY MERRY TECH CO LTD1 citations51
US10390596B2Aug 27, 2019
Aluminum plate-coated multifunctional hair straightener
SHENZHEN LADY MERRY TECH CO LTD0 citations41
LAM RES CORP
9 patentsUS10572697B2Feb 25, 2020
Method of etch model calibration using optical scatterometry
LAM RES CORP9 citations83
US10262910B2Apr 16, 2019
Method of feature exaction from time-series of spectra to control endpoint of process
LAM RES CORP12 citations83
US11704463B2Jul 18, 2023
Method of etch model calibration using optical scatterometry
LAM RES CORP1 citations72
US10997345B2May 4, 2021
Method of etch model calibration using optical scatterometry
LAM RES CORP3 citations72
US12360510B2Jul 15, 2025
Large spot spectral sensing to control spatial setpoints
LAM RES CORP0 citations61
US11885750B2Jan 30, 2024
Integrated wafer bow measurements
LAM RES CORP0 citations61
US11921433B2Mar 5, 2024
Optical metrology in machine learning to characterize features
LAM RES CORP0 citations60
US10989652B2Apr 27, 2021
Systems and methods for combining optical metrology with mass metrology
LAM RES CORP1 citations56
US10847430B2Nov 24, 2020
Method of feature exaction from time-series of spectra to control endpoint of process
LAM RES CORP0 citations51
FENG YE
5 patentsUS8062910B1Nov 22, 2011
Measurement of a sample using multiple models
FENG YE7 citations82
US8068228B2Nov 29, 2011
In-plane optical metrology
FENG YE5 citations73
US8462345B2Jun 11, 2013
In-plane optical metrology
FENG YE3 citations62
US8501501B1Aug 6, 2013
Measurement of a sample using multiple models
FENG YE2 citations61
US8252608B1Aug 28, 2012
Measurement of a sample using multiple models
FENG YE1 citations61
NANOMETRICS INC
3 patentsUS7465590B1Dec 16, 2008
Measurement of a sample using multiple models
NANOMETRICS INC10 citations83
US7450225B1Nov 11, 2008
Correction of optical metrology for focus offset
NANOMETRICS INC11 citations81
US10296554B2May 21, 2019
Correction of angular error of plane-of-incidence azimuth of optical metrology device
NANOMETRICS INC2 citations72
CRRC YANGTZE CO LTD
2 patentsUS11753279B2Sep 12, 2023
Vehicle frame, aerial transportation vehicle, and aerial rail container transportation method
CRRC YANGTZE CO LTD0 citations44
US11731860B2Aug 22, 2023
Lifting vehicle frame, aerial transportation vehicle and aerial rail container transportation method
CRRC YANGTZE CO LTD0 citations43