Inventor

ANDBERG JOHN W

US6 patents

⚠️ This page may combine multiple inventors who share the name “ANDBERG JOHN W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

AEHR TEST SYSTEMS

1 patent

US6140616AOct 31, 2000

Wafer level burn-in and test thermal chuck and method

AEHR TEST SYSTEMS33 citations89

ADVANTEST CORP

1 patent

US10297339B2May 21, 2019

Integrated cooling system for electronics testing apparatus

ADVANTEST CORP21 citations87

VERIGY IPCO

1 patent

US7147499B1Dec 12, 2006

Zero insertion force printed circuit assembly connector system and method

VERIGY IPCO13 citations80

ANDBERG JOHN W

1 patent

US9335347B2May 10, 2016

Method and apparatus for massively parallel multi-wafer test

ANDBERG JOHN W3 citations60

VERIGY PTE LTD SINGAPORE

1 patent

US7459921B2Dec 2, 2008

Method and apparatus for a paddle board probe card

VERIGY PTE LTD SINGAPORE2 citations60

ADVANTEST SINGAPORE PTE LTD

1 patent

US8354853B2Jan 15, 2013

Test electronics to device under test interfaces, and methods and apparatus using same

ADVANTEST SINGAPORE PTE LTD0 citations47