Inventor
LEE JIN IL
KR32 patents
⚠️ This page may combine multiple inventors who share the name “LEE JIN IL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
20 patentsUS7943502B2May 17, 2011
Method of forming a phase change memory device
SAMSUNG ELECTRONICS CO LTD26 citations92
US7727884B2Jun 1, 2010
Methods of forming a semiconductor device including a phase change material layer
SAMSUNG ELECTRONICS CO LTD19 citations92
US7569417B2Aug 4, 2009
Method of forming a phase changeable material layer, a method of manufacturing a phase changeable memory unit, and a method of manufacturing a phase changeable semiconductor memory device
SAMSUNG ELECTRONICS CO LTD38 citations92
US7271055B2Sep 18, 2007
Methods of forming low leakage currents metal-insulator-metal (MIM) capacitors and related MIM capacitors
SAMSUNG ELECTRONICS CO LTD26 citations92
US7514315B2Apr 7, 2009
Methods of forming capacitor structures having aluminum oxide diffusion barriers
SAMSUNG ELECTRONICS CO LTD8 citations84
US8034683B2Oct 11, 2011
Method of forming a phase change material layer, method of forming a phase change memory device using the same, and a phase change memory device so formed
SAMSUNG ELECTRONICS CO LTD8 citations83
US7759667B2Jul 20, 2010
Phase change memory device including resistant material
SAMSUNG ELECTRONICS CO LTD17 citations83
US7049232B2May 23, 2006
Methods for forming ruthenium films with β-diketone containing ruthenium complexes and method for manufacturing metal-insulator-metal capacitor using the same
SAMSUNG ELECTRONICS CO LTD8 citations74
US10366955B2Jul 30, 2019
Semiconductor device including conductive structure having nucleation structure and method of forming the same
SAMSUNG ELECTRONICS CO LTD1 citations72
US7838326B2Nov 23, 2010
Methods of fabricating semiconductor device including phase change layer
SAMSUNG ELECTRONICS CO LTD5 citations63
US7803654B2Sep 28, 2010
Variable resistance non-volatile memory cells and methods of fabricating same
SAMSUNG ELECTRONICS CO LTD6 citations63
US7432183B2Oct 7, 2008
Methods of manufacturing a thin film including zirconium titanium oxide and methods of manufacturing a gate structure, a capacitor and a flash memory device including the same
SAMSUNG ELECTRONICS CO LTD3 citations63
US7091102B2Aug 15, 2006
Methods of forming integrated circuit devices having a capacitor with a hydrogen barrier spacer on a sidewall thereof and integrated circuit devices formed thereby
SAMSUNG ELECTRONICS CO LTD4 citations63
US7034350B2Apr 25, 2006
Capacitors including a cavity containing a buried layer
SAMSUNG ELECTRONICS CO LTD3 citations63
US7867880B2Jan 11, 2011
Metal precursors for low temperature deposition and methods of forming a metal thin layer and manufacturing a phase-change memory device using the metal precursors
SAMSUNG ELECTRONICS CO LTD6 citations62
US8834968B2Sep 16, 2014
Method of forming phase change material layer using Ge(II) source, and method of fabricating phase change memory device
SAMSUNG ELECTRONICS CO LTD0 citations52
US8021977B2Sep 20, 2011
Methods of forming contact structures and semiconductor devices fabricated using contact structures
SAMSUNG ELECTRONICS CO LTD0 citations52
US10847464B2Nov 24, 2020
Semiconductor device including conductive structure having nucleation structure and method of forming the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US10580736B2Mar 3, 2020
Semiconductor device including conductive structure having nucleation structure and method of forming the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US7855145B2Dec 21, 2010
Gap filling method and method for forming semiconductor memory device using the same
SAMSUNG ELECTRONICS CO LTD0 citations41
PARK HYE-YOUNG
2 patentsBAE BYOUNG-JAE
2 patentsUS8142846B2Mar 27, 2012
Method of forming phase change material layer using Ge(II) source, and method of fabrication phase change memory device
BAE BYOUNG-JAE4 citations61
US8852686B2Oct 7, 2014
Method of forming phase change material layer using Ge(II) source, and method of fabricating phase change memory device
BAE BYOUNG-JAE0 citations51