Inventor

HUNT-SCHROEDER ERIC D

US36 patents

⚠️ This page may combine multiple inventors who share the name “HUNT-SCHROEDER ERIC D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HUNT-SCHROEDER ERIC D

GLOBALFOUNDRIES INC

Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing

Voltage-aware adaptive static random access memory (SRAM) write assist circuit

Word line voltage generator for programmable memory array

Operational amplifier with current-controlled up or down hysteresis

Word line voltage generator for calculating optimum word line voltage level for programmable memory array

Static random access memory (SRAM) write assist circuit with improved boost

IC structure with interdigitated conductive elements between metal guard structures

Parallel programming of one time programmable memory array for reduced test time

Sensing circuits for charge trap transistors

Sequential read mode static random access memory (SRAM)

Latching current sensing amplifier for memory array

Zero test time memory using background built-in self-test

Margin test for multiple-time programmable memory (MTPM) with split wordlines

Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing

Environmentally aware mobile computing devices

Double bandwidth algorithmic memory array

Application specific integrated circuit (ASIC) test screens and selection of such screens

MARVELL ASIA PTE LTD

Charge pump circuit with internal pre-charge configuration

In-memory computing using a static random-access memory (SRAM)

Voltage power switch

Voltage power switch

Structures and methods for deriving stable physical unclonable functions from semiconductor devices

Built-in circuit for testing process and layout effects of an integrated circuit die

Method and apparatus for faster bitcell operation

IBM

Customer-transparent logic redundancy for improved yield

Latching current sensing amplifier for memory array

Customer-transparent logic redundancy for improved yield

Customer-transparent logic redundancy for improved yield

Customer-transparent logic redundancy for improved yield

Customer-transparent logic redundancy for improved yield

GLOBALFOUNDRIES US INC

Cascaded sensing circuits for detecting and monitoring cracks in an integrated circuit

Crack detecting and monitoring system for an integrated circuit

Cascaded sensing circuits for detecting and monitoring cracks in an integrated circuit

MARVELL INT LTD

High-density high-bandwidth static random access memory (SRAM) with phase shifted sequential read

Zero test time memory using background built-in self-test

Ultra-low voltage level shifter