Inventor
POZZI-LOYOLA SCOTT
US10 patents
Patents
10 patentsUS10545096B1Jan 28, 2020
Marco inspection systems, apparatus and methods
NANOTRONICS IMAGING INC7 citations82
US10254214B1Apr 9, 2019
Systems, devices, and methods for combined wafer and photomask inspection
NANOTRONICS IMAGING INC6 citations78
US10915992B1Feb 9, 2021
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC3 citations71
US11995802B2May 28, 2024
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations61
US11663703B2May 30, 2023
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations61
US11656184B2May 23, 2023
Macro inspection systems, apparatus and methods
NANOTRONICS IMAGING INC0 citations61
US11408829B2Aug 9, 2022
Macro inspection systems, apparatus and methods
NANOTRONICS IMAGING INC0 citations61
US11341617B2May 24, 2022
System, method and apparatus for macroscopic inspection of reflective specimens
NANOTRONICS IMAGING INC0 citations61
US10914686B2Feb 9, 2021
Macro inspection systems, apparatus and methods
NANOTRONICS IMAGING INC0 citations61
US11125677B2Sep 21, 2021
Systems, devices, and methods for combined wafer and photomask inspection
NANOTRONICS IMAGING INC1 citations56