Inventor
WEIDNER JOERG-OLIVER
DE2 patents
Patents
2 patentsUS7340360B1Mar 4, 2008
Method for determining projected lifetime of semiconductor devices with analytical extension of stress voltage window by scaling of oxide thickness
ADVANCED MICRO DEVICES INC7 citations70
US6995027B2Feb 7, 2006
Integrated semiconductor structure for reliability tests of dielectrics
ADVANCED MICRO DEVICES INC6 citations57