P

Inventor

FUJII TOSHIHIKO

JP44 patents
⚠️ This page may combine multiple inventors who share the name “FUJII TOSHIHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHINETSU CHEMICAL CO

14 patents
US7510820B2Mar 31, 2009

Resist undercoat-forming material and patterning process

SHINETSU CHEMICAL CO24 citations93
US6440646B2Aug 27, 2002

Positive resist composition suitable for lift-off technique and pattern forming method

SHINETSU CHEMICAL CO21 citations92
US6210855B1Apr 3, 2001

Positive resist composition suitable for lift-off technique and pattern forming method

SHINETSU CHEMICAL CO35 citations92
US9372404B2Jun 21, 2016

Organic film composition, method for forming organic film and patterning process using this, and heat-decomposable polymer

SHINETSU CHEMICAL CO8 citations84
US8652757B2Feb 18, 2014

Method for forming resist underlayer film, patterning process using the same, and composition for the resist underlayer film

SHINETSU CHEMICAL CO12 citations84
US7745104B2Jun 29, 2010

Bottom resist layer composition and patterning process using the same

SHINETSU CHEMICAL CO15 citations84
US6899991B2May 31, 2005

Photo-curable resin composition, patterning process, and substrate protecting film

SHINETSU CHEMICAL CO13 citations84
US7632624B2Dec 15, 2009

Photoresist undercoat-forming material and patterning process

SHINETSU CHEMICAL CO17 citations81
US6867325B2Mar 15, 2005

Organosiloxane polymer, photo-curable resin composition, patterning process, and substrate-protecting coat

SHINETSU CHEMICAL CO10 citations74
US6713612B2Mar 30, 2004

Sulfonyldiazomethanes, photoacid generators, resist compositions, and patterning process

SHINETSU CHEMICAL CO7 citations74
US9230827B2Jan 5, 2016

Method for forming a resist under layer film and patterning process

SHINETSU CHEMICAL CO4 citations73
US7871761B2Jan 18, 2011

Resist lower layer material, resist lower layer substrate comprising the material and method for forming pattern

SHINETSU CHEMICAL CO5 citations63
US6866982B2Mar 15, 2005

Resist composition and patterning process

SHINETSU CHEMICAL CO2 citations63
US7550247B2Jun 23, 2009

Resist composition and patterning process

SHINETSU CHEMICAL CO1 citations52

NISSAN MOTOR

9 patents

OGIHARA TSUTOMU

5 patents

FUJITSU LTD

3 patents

FUJITSU TEN LTD

3 patents

HATAKEYAMA JUN

2 patents

YOKOWO SEISAKUSHO KK

2 patents

WATANABE TAKERU

2 patents

BASILEA PHARMACEUTICA AG

1 patent

SONY CORP

1 patent

HOFFMANN LA ROCHE

1 patent

DENSO TEN LTD

1 patent