Inventor
BHATTACHARYA PARTHAJIT
IN7 patents
⚠️ This page may combine multiple inventors who share the name “BHATTACHARYA PARTHAJIT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SYNOPSYS INC
6 patentsUS10605863B2Mar 31, 2020
Mapping physical shift failures to scan cells for detecting physical faults in integrated circuits
SYNOPSYS INC1 citations56
US10067187B2Sep 4, 2018
Handling of undesirable distribution of unknown values in testing of circuit using automated test equipment
SYNOPSYS INC0 citations48
US9417287B2Aug 16, 2016
Scheme for masking output of scan chains in test circuit
SYNOPSYS INC0 citations47
US9568550B1Feb 14, 2017
Identifying failure indicating scan test cells of a circuit-under-test
SYNOPSYS INC1 citations46
US9411014B2Aug 9, 2016
Reordering or removal of test patterns for detecting faults in integrated circuit
SYNOPSYS INC0 citations44
US9329235B2May 3, 2016
Localizing fault flop in circuit by using modified test pattern
SYNOPSYS INC0 citations39