Inventor
TAKASU HISAYUKI
JP31 patents
⚠️ This page may combine multiple inventors who share the name “TAKASU HISAYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
28 patentsUS10304653B2May 28, 2019
Ion milling device, ion source and ion milling method
HITACHI HIGH TECH CORP3 citations72
US11226273B2Jan 18, 2022
Sample holder, ion milling apparatus, sample processing method, sample observing method, and sample processing and observing method
HITACHI HIGH TECH CORP3 citations71
US11621141B2Apr 4, 2023
Ion milling device and ion milling method
HITACHI HIGH TECH CORP2 citations70
US12051560B2Jul 30, 2024
Ion gun and ion milling machine
HITACHI HIGH TECH CORP0 citations62
US11158481B2Oct 26, 2021
Ion milling device, ion source, and ion milling method
HITACHI HIGH TECH CORP0 citations62
US10361065B2Jul 23, 2019
Ion milling system
HITACHI HIGH TECH CORP1 citations62
US11894213B2Feb 6, 2024
Ion milling device
HITACHI HIGH TECH CORP0 citations61
US11004652B2May 11, 2021
Ion milling device
HITACHI HIGH TECH CORP0 citations61
US12567557B2Mar 3, 2026
Ion milling device and ion milling method
HITACHI HIGH TECH CORP0 citations59
US11508552B2Nov 22, 2022
Ion milling device
HITACHI HIGH TECH CORP1 citations59
US11133153B2Sep 28, 2021
Ion milling device
HITACHI HIGH TECH CORP0 citations59
US12080511B2Sep 3, 2024
Sample holder, method for using sample holder, projection amount adjustment jig, projection amount adjustment method and charged particle beam device
HITACHI HIGH TECH CORP0 citations58
US12020893B2Jun 25, 2024
Ion milling device
HITACHI HIGH TECH CORP0 citations51
US11257654B2Feb 22, 2022
Ion milling apparatus
HITACHI HIGH TECH CORP0 citations51
US11244802B2Feb 8, 2022
Ion milling device and ion source adjusting method for ion milling device
HITACHI HIGH TECH CORP0 citations50
US10192710B2Jan 29, 2019
Ion milling apparatus and ion milling method
HITACHI HIGH TECH CORP0 citations50
US10008365B2Jun 26, 2018
Ion milling device
HITACHI HIGH TECH CORP0 citations49
US9499900B2Nov 22, 2016
Ion milling device
HITACHI HIGH TECH CORP0 citations49
US10515777B2Dec 24, 2019
Ion milling device and processing method using the ion milling device
HITACHI HIGH TECH CORP0 citations48
US9761412B2Sep 12, 2017
Ion milling apparatus and sample processing method
HITACHI HIGH TECH CORP0 citations48
US9558912B2Jan 31, 2017
Ion milling device
HITACHI HIGH TECH CORP0 citations48
US12230471B2Feb 18, 2025
Ion milling device
HITACHI HIGH TECH CORP0 citations47
US12224155B2Feb 11, 2025
Ion milling device
HITACHI HIGH TECH CORP0 citations47
US11742178B2Aug 29, 2023
Ion milling device and milling processing method using same
HITACHI HIGH TECH CORP0 citations47
US10269534B2Apr 23, 2019
Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device
HITACHI HIGH TECH CORP0 citations47
US9343265B2May 17, 2016
Charged particle beam irradiation apparatus
HITACHI HIGH TECH CORP0 citations45
US10332722B2Jun 25, 2019
Ion milling device and ion milling method
HITACHI HIGH TECH CORP0 citations41
US10832889B2Nov 10, 2020
Charged particle beam device
HITACHI HIGH TECH CORP0 citations40