Inventor
HAZAKI EIICHI
JP23 patents
⚠️ This page may combine multiple inventors who share the name “HAZAKI EIICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
12 patentsUS6403968B1Jun 11, 2002
Scanning electron microscope
HITACHI LTD55 citations95
US5081353AJan 14, 1992
Combined scanning electron and scanning tunnelling microscope apparatus and method
HITACHI LTD65 citations95
US4502852AMar 5, 1985
Oil feeding device for scroll fluid apparatus
HITACHI LTD28 citations92
US4462772AJul 31, 1984
Oil feeding device for scroll fluid apparatus
HITACHI LTD32 citations92
US4639146AJan 27, 1987
Thrust bearing
HITACHI LTD41 citations91
US4551082ANov 5, 1985
Bearing device of sealed type scroll compressor
HITACHI LTD22 citations82
US5026995AJun 25, 1991
Particle beam surface analyzer
HITACHI LTD19 citations74
US4473343ASep 25, 1984
Bearing device for scroll-type compressor
HITACHI LTD14 citations74
US5393977AFeb 28, 1995
Charged particle beam apparatus and it's operating method
HITACHI LTD14 citations73
US5256876AOct 26, 1993
Scanning tunnel microscope equipped with scanning electron microscope
HITACHI LTD12 citations73
US4749344AJun 7, 1988
Oil feeding device for scroll fluid apparatus
HITACHI LTD13 citations73
US4555224ANov 26, 1985
Oil feeding device for scroll fluid apparatus
HITACHI LTD11 citations73
HITACHI HIGH TECH CORP
7 patentsUS7372283B2May 13, 2008
Probe navigation method and device and defect inspection device
HITACHI HIGH TECH CORP19 citations92
US7297945B2Nov 20, 2007
Defective product inspection apparatus, probe positioning method and probe moving method
HITACHI HIGH TECH CORP18 citations92
US7071713B2Jul 4, 2006
Probe navigation method and device and defect inspection device
HITACHI HIGH TECH CORP25 citations92
US7553334B2Jun 30, 2009
Defective product inspection apparatus, probe positioning method and probe moving method
HITACHI HIGH TECH CORP9 citations84
US7015483B2Mar 21, 2006
Focused ion beam system
HITACHI HIGH TECH CORP15 citations84
US7129727B2Oct 31, 2006
Defect inspecting apparatus
HITACHI HIGH TECH CORP13 citations82
US7598755B2Oct 6, 2009
Probe navigation method and device and defect inspection device
HITACHI HIGH TECH CORP7 citations74