Inventor
TAMAKI HIROKAZU
JP12 patents
⚠️ This page may combine multiple inventors who share the name “TAMAKI HIROKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
8 patentsUS11380514B2Jul 5, 2022
Charged particle beam system
HITACHI HIGH TECH CORP2 citations70
US10636621B2Apr 28, 2020
Charged particle beam device for moving an aperture having plurality of openings and sample observation method
HITACHI HIGH TECH CORP1 citations58
US11791131B2Oct 17, 2023
Charged particle beam apparatus and method for controlling charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations56
US10535497B2Jan 14, 2020
Electron microscope and imaging method
HITACHI HIGH TECH CORP0 citations51
US12525429B2Jan 13, 2026
Charged particle beam system
HITACHI HIGH TECH CORP0 citations49
US11756764B2Sep 12, 2023
Charged particle beam apparatus and method of controlling charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations48
US9715991B2Jul 25, 2017
Charged particle beam device and spherical aberration correction method
HITACHI HIGH TECH CORP0 citations48
US11742172B2Aug 29, 2023
Charged particle beam device and control method thereof
HITACHI HIGH TECH CORP0 citations47
HITACHI LTD
3 patentsUS7650456B2Jan 19, 2010
Employment method of virtual tape volume
HITACHI LTD3 citations57
US7263574B2Aug 28, 2007
Employment method of virtual tape volume
HITACHI LTD5 citations57
US11380518B2Jul 5, 2022
Measurement system and method for setting observation conditions of measurement apparatus
HITACHI LTD0 citations47