Inventor
SHIMOMURA TAKEHIKO
JP13 patents
⚠️ This page may combine multiple inventors who share the name “SHIMOMURA TAKEHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
8 patentsUS6711708B1Mar 23, 2004
Boundary-scan test method and device
MITSUBISHI ELECTRIC CORP41 citations91
US6150886ANov 21, 2000
Phase locked loop circuit with multiple combinations which each produce a single phase and multiphase clock signals
MITSUBISHI ELECTRIC CORP30 citations91
US6091351AJul 18, 2000
A/D converter and level shifter
MITSUBISHI ELECTRIC CORP16 citations83
US5956270ASep 21, 1999
Flash memory and microcomputer
MITSUBISHI ELECTRIC CORP18 citations83
US5898396AApr 27, 1999
Analog-to-digital converter for both m-bit and n-bit analog conversion
MITSUBISHI ELECTRIC CORP13 citations72
US5590035ADec 31, 1996
Output control circuit
MITSUBISHI ELECTRIC CORP5 citations62
US5737381AApr 7, 1998
Counting device
MITSUBISHI ELECTRIC CORP5 citations61
US6674153B2Jan 6, 2004
Semiconductor device utilizing pad to pad wire interconnection for improving detection of failed region on the device
MITSUBISHI ELECTRIC CORP0 citations41
RENESAS TECH CORP
4 patentsUS6789174B2Sep 7, 2004
Memory access device allowing simultaneous access
RENESAS TECH CORP15 citations83
US6865703B2Mar 8, 2005
Scan test system for semiconductor device
RENESAS TECH CORP4 citations62
US7028123B2Apr 11, 2006
Microcomputer, has selection circuit to select either testing-purpose interrupt request signal or interrupt request selection signal based on delayed selection signal, where selected signals are sent to interrupt controller
RENESAS TECH CORP1 citations51
US6819580B2Nov 16, 2004
Semiconductor chip selectively providing a predetermined potential to a dead pin
RENESAS TECH CORP0 citations51