Inventor
KAKIZAWA AKIRA
US13 patents
Patents
13 patentsUS6580556B2Jun 17, 2003
Viewing stereoscopic image pairs
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US6725406B2Apr 20, 2004
Method and apparatus for failure detection utilizing functional test vectors and scan mode
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US6566857B1May 20, 2003
Testing of digital-to-analog converters
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US7154288B2Dec 26, 2006
Method and an apparatus for testing transmitter and receiver
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US6410359B2Jun 25, 2002
Reduced leakage trench isolation
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US6259145B1Jul 10, 2001
Reduced leakage trench isolation
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US6215165B1Apr 10, 2001
Reduced leakage trench isolation
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US7061224B2Jun 13, 2006
Test circuit for delay lock loops
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US6889350B2May 3, 2005
Method and apparatus for testing an I/O buffer
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US7002365B2Feb 21, 2006
Method and an apparatus for testing transmitter and receiver
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US6403394B2Jun 11, 2002
Reduced leakage trench isolation
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US9658288B2May 23, 2017
Alternating current coupled electronic component test system and method
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US9389274B2Jul 12, 2016
Alternating current coupled electronic component test system and method
INTEL CORP1 citations49