Inventor
CAI XIUYU
US172 patents
⚠️ This page may combine multiple inventors who share the name “CAI XIUYU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBALFOUNDRIES INC
22 patentsUS8703557B1Apr 22, 2014
Methods of removing dummy fin structures when forming finFET devices
GLOBALFOUNDRIES INC63 citations98
US9190260B1Nov 17, 2015
Topological method to build self-aligned MTJ without a mask
GLOBALFOUNDRIES INC39 citations94
US9190486B2Nov 17, 2015
Integrated circuits and methods for fabricating integrated circuits with reduced parasitic capacitance
GLOBALFOUNDRIES INC35 citations94
US9147748B1Sep 29, 2015
Methods of forming replacement spacer structures on semiconductor devices
GLOBALFOUNDRIES INC36 citations94
US9070742B2Jun 30, 2015
FinFet integrated circuits with uniform fin height and methods for fabricating the same
GLOBALFOUNDRIES INC24 citations93
US9064890B1Jun 23, 2015
Methods of forming isolation material on FinFET semiconductor devices and the resulting devices
GLOBALFOUNDRIES INC25 citations93
US8921191B2Dec 30, 2014
Integrated circuits including FINFET devices with lower contact resistance and reduced parasitic capacitance and methods for fabricating the same
GLOBALFOUNDRIES INC30 citations93
US8841711B1Sep 23, 2014
Methods of increasing space for contact elements by using a sacrificial liner and the resulting device
GLOBALFOUNDRIES INC23 citations93
US8835262B2Sep 16, 2014
Methods of forming bulk FinFET devices by performing a recessing process on liner materials to define different fin heights and FinFET devices with such recessed liner materials
GLOBALFOUNDRIES INC21 citations93
US9634115B2Apr 25, 2017
Methods of forming a protection layer on a semiconductor device and the resulting device
GLOBALFOUNDRIES INC8 citations84
US9530775B2Dec 27, 2016
Methods of forming different FinFET devices having different fin heights and an integrated circuit product containing such devices
GLOBALFOUNDRIES INC8 citations84
US9431539B2Aug 30, 2016
Dual-strained nanowire and FinFET devices with dielectric isolation
GLOBALFOUNDRIES INC11 citations84
US9425319B2Aug 23, 2016
Integrated circuits including FINFET devices with lower contact resistance and reduced parasitic capacitance and methods for fabricating the same
GLOBALFOUNDRIES INC6 citations84
US9425280B2Aug 23, 2016
Semiconductor device with low-K spacers
GLOBALFOUNDRIES INC6 citations84
US9412822B2Aug 9, 2016
Methods of forming stressed channel regions for a FinFET semiconductor device and the resulting device
GLOBALFOUNDRIES INC9 citations84
US9390939B2Jul 12, 2016
Methods of forming MIS contact structures for semiconductor devices and the resulting devices
GLOBALFOUNDRIES INC8 citations84
US9337050B1May 10, 2016
Methods of forming fins for finFET semiconductor devices and the selective removal of such fins
GLOBALFOUNDRIES INC20 citations84
US9269815B2Feb 23, 2016
FinFET semiconductor device with a recessed liner that defines a fin height of the FinFet device
GLOBALFOUNDRIES INC12 citations84
US9236480B2Jan 12, 2016
Methods of forming finFET semiconductor devices using a replacement gate technique and the resulting devices
GLOBALFOUNDRIES INC6 citations84
US9196696B2Nov 24, 2015
Integrated circuits with improved gate uniformity and methods for fabricating same
GLOBALFOUNDRIES INC10 citations84
US9153498B2Oct 6, 2015
Methods of forming semiconductor device with self-aligned contact elements and the resulting devices
GLOBALFOUNDRIES INC18 citations84
US9142651B1Sep 22, 2015
Methods of forming a FinFET semiconductor device so as to reduce punch-through leakage currents and the resulting device
GLOBALFOUNDRIES INC17 citations84
ST MICROELECTRONICS INC
15 patentsUS9502518B2Nov 22, 2016
Multi-channel gate-all-around FET
ST MICROELECTRONICS INC46 citations98
US9748352B2Aug 29, 2017
Multi-channel gate-all-around FET
ST MICROELECTRONICS INC28 citations94
US9391200B2Jul 12, 2016
FinFETs having strained channels, and methods of fabricating finFETs having strained channels
ST MICROELECTRONICS INC27 citations94
US9202920B1Dec 1, 2015
Methods for forming vertical and sharp junctions in finFET structures
ST MICROELECTRONICS INC42 citations94
US9082852B1Jul 14, 2015
LDMOS FinFET device using a long channel region and method of manufacture
ST MICROELECTRONICS INC32 citations94
US9202919B1Dec 1, 2015
FinFETs and techniques for controlling source and drain junction profiles in finFETs
ST MICROELECTRONICS INC21 citations93
US9859423B2Jan 2, 2018
Hetero-channel FinFET
ST MICROELECTRONICS INC8 citations84
US9660057B2May 23, 2017
Method of forming a reduced resistance fin structure
ST MICROELECTRONICS INC8 citations84
US9660083B2May 23, 2017
LDMOS finFET device and method of manufacture using a trench confined epitaxial growth process
ST MICROELECTRONICS INC9 citations84
US9653579B2May 16, 2017
Method for making semiconductor device with filled gate line end recesses
ST MICROELECTRONICS INC10 citations84
US9466722B2Oct 11, 2016
Large area contacts for small transistors
ST MICROELECTRONICS INC11 citations84
US9431540B2Aug 30, 2016
Method for making a semiconductor device with sidewall spacers for confining epitaxial growth
ST MICROELECTRONICS INC5 citations84
US9299721B2Mar 29, 2016
Method for making semiconductor device with different fin sets
ST MICROELECTRONICS INC14 citations84
US9281382B2Mar 8, 2016
Method for making semiconductor device with isolation pillars between adjacent semiconductor fins
ST MICROELECTRONICS INC16 citations84
US9263338B2Feb 16, 2016
Semiconductor device including vertically spaced semiconductor channel structures and related methods
ST MICROELECTRONICS INC13 citations84
IBM
9 patentsUS9455331B1Sep 27, 2016
Method and structure of forming controllable unmerged epitaxial material
IBM66 citations98
US9660050B1May 23, 2017
Replacement low-k spacer
IBM14 citations93
US10276573B2Apr 30, 2019
FinFET including tunable fin height and tunable fin width ratio
IBM6 citations84
US10134840B2Nov 20, 2018
Series resistance reduction in vertically stacked silicon nanowire transistors
IBM8 citations84
US9917195B2Mar 13, 2018
High doped III-V source/drain junctions for field effect transistors
IBM4 citations84
US9564358B1Feb 7, 2017
Forming reliable contacts on tight semiconductor pitch
IBM10 citations84
US9559009B2Jan 31, 2017
Gate structure cut after formation of epitaxial active regions
IBM8 citations84
US9425292B1Aug 23, 2016
Field effect transistor device spacers
IBM6 citations84
US9190487B2Nov 17, 2015
Prevention of fin erosion for semiconductor devices
IBM9 citations84
XIE RUILONG
2 patentsUS8580634B1Nov 12, 2013
Methods of forming 3-D semiconductor devices with a nanowire gate structure wherein the nanowire gate structure is formed prior to source/drain formation
XIE RUILONG22 citations93
US8753970B2Jun 17, 2014
Methods of forming semiconductor devices with self-aligned contacts and the resulting devices
XIE RUILONG24 citations92
CAI XIUYU
1 patentILLUMINA INC
1 patentShowing the top 50 of 172 patents by PatentIndex Score.