Inventor
BARNS CHRIS E
US36 patents
⚠️ This page may combine multiple inventors who share the name “BARNS CHRIS E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
32 patentsUS7569443B2Aug 4, 2009
Complementary metal oxide semiconductor integrated circuit using raised source drain and replacement metal gate
INTEL CORP72 citations98
US7220635B2May 22, 2007
Method for making a semiconductor device with a metal gate electrode that is formed on an annealed high-k gate dielectric layer
INTEL CORP78 citations98
US7217611B2May 15, 2007
Methods for integrating replacement metal gate structures
INTEL CORP70 citations98
US7208361B2Apr 24, 2007
Replacement gate process for making a semiconductor device that includes a metal gate electrode
INTEL CORP128 citations98
US7157378B2Jan 2, 2007
Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode
INTEL CORP107 citations98
US7153734B2Dec 26, 2006
CMOS device with metal and silicide gate electrodes and a method for making it
INTEL CORP64 citations98
US7153784B2Dec 26, 2006
Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode
INTEL CORP86 citations98
US6858483B2Feb 22, 2005
Integrating n-type and p-type metal gate transistors
INTEL CORP81 citations98
US7018918B2Mar 28, 2006
Method of forming a selectively converted inter-layer dielectric using a porogen material
INTEL CORP76 citations97
US7355281B2Apr 8, 2008
Method for making semiconductor device having a high-k gate dielectric layer and a metal gate electrode
INTEL CORP47 citations96
US7316949B2Jan 8, 2008
Integrating n-type and p-type metal gate transistors
INTEL CORP50 citations96
US7138323B2Nov 21, 2006
Planarizing a semiconductor structure to form replacement metal gates
INTEL CORP51 citations96
US6972225B2Dec 6, 2005
integrating n-type and P-type metal gate transistors
INTEL CORP54 citations96
US6953719B2Oct 11, 2005
Integrating n-type and p-type metal gate transistors
INTEL CORP62 citations96
US7183184B2Feb 27, 2007
Method for making a semiconductor device that includes a metal gate electrode
INTEL CORP54 citations93
US7078282B2Jul 18, 2006
Replacement gate flow facilitating high yield and incorporation of etch stop layers and/or stressed films
INTEL CORP42 citations93
US6743683B2Jun 1, 2004
Polysilicon opening polish
INTEL CORP31 citations93
US7271045B2Sep 18, 2007
Etch stop and hard mask film property matching to enable improved replacement metal gate process
INTEL CORP45 citations92
US7166506B2Jan 23, 2007
Poly open polish process
INTEL CORP34 citations92
US7045428B2May 16, 2006
Method for making a semiconductor device with a high-k gate dielectric and a conductor that facilitates current flow across a P/N junction
INTEL CORP20 citations92
US6943121B2Sep 13, 2005
Selectively converted inter-layer dielectric
INTEL CORP43 citations92
US6908863B2Jun 21, 2005
Sacrificial dielectric planarization layer
INTEL CORP24 citations92
US7422936B2Sep 9, 2008
Facilitating removal of sacrificial layers via implantation to form replacement metal gates
INTEL CORP39 citations90
US7754552B2Jul 13, 2010
Preventing silicide formation at the gate electrode in a replacement metal gate technology
INTEL CORP8 citations84
US7671471B2Mar 2, 2010
Method for making a semiconductor device having a high-k dielectric layer and a metal gate electrode
INTEL CORP8 citations84
US6705928B1Mar 16, 2004
Through-pad slurry delivery for chemical-mechanical polish
INTEL CORP15 citations84
US7144816B2Dec 5, 2006
Polysilicon opening polish
INTEL CORP6 citations74
US7109557B2Sep 19, 2006
Sacrificial dielectric planarization layer
INTEL CORP6 citations74
US7883951B2Feb 8, 2011
CMOS device with metal and silicide gate electrodes and a method for making it
INTEL CORP3 citations63
US7239019B2Jul 3, 2007
Selectively converted inter-layer dielectric
INTEL CORP2 citations62
US7666465B2Feb 23, 2010
Introducing nanotubes in trenches and structures formed thereby
INTEL CORP1 citations52
US7205236B2Apr 17, 2007
Semiconductor substrate polishing methods and equipment
INTEL CORP0 citations52