P

Inventor

BARNS CHRIS E

US36 patents
⚠️ This page may combine multiple inventors who share the name “BARNS CHRIS E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

32 patents
US7569443B2Aug 4, 2009

Complementary metal oxide semiconductor integrated circuit using raised source drain and replacement metal gate

INTEL CORP72 citations98
US7220635B2May 22, 2007

Method for making a semiconductor device with a metal gate electrode that is formed on an annealed high-k gate dielectric layer

INTEL CORP78 citations98
US7217611B2May 15, 2007

Methods for integrating replacement metal gate structures

INTEL CORP70 citations98
US7208361B2Apr 24, 2007

Replacement gate process for making a semiconductor device that includes a metal gate electrode

INTEL CORP128 citations98
US7157378B2Jan 2, 2007

Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP107 citations98
US7153734B2Dec 26, 2006

CMOS device with metal and silicide gate electrodes and a method for making it

INTEL CORP64 citations98
US7153784B2Dec 26, 2006

Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP86 citations98
US6858483B2Feb 22, 2005

Integrating n-type and p-type metal gate transistors

INTEL CORP81 citations98
US7018918B2Mar 28, 2006

Method of forming a selectively converted inter-layer dielectric using a porogen material

INTEL CORP76 citations97
US7355281B2Apr 8, 2008

Method for making semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP47 citations96
US7316949B2Jan 8, 2008

Integrating n-type and p-type metal gate transistors

INTEL CORP50 citations96
US7138323B2Nov 21, 2006

Planarizing a semiconductor structure to form replacement metal gates

INTEL CORP51 citations96
US6972225B2Dec 6, 2005

integrating n-type and P-type metal gate transistors

INTEL CORP54 citations96
US6953719B2Oct 11, 2005

Integrating n-type and p-type metal gate transistors

INTEL CORP62 citations96
US7183184B2Feb 27, 2007

Method for making a semiconductor device that includes a metal gate electrode

INTEL CORP54 citations93
US7078282B2Jul 18, 2006

Replacement gate flow facilitating high yield and incorporation of etch stop layers and/or stressed films

INTEL CORP42 citations93
US6743683B2Jun 1, 2004

Polysilicon opening polish

INTEL CORP31 citations93
US7271045B2Sep 18, 2007

Etch stop and hard mask film property matching to enable improved replacement metal gate process

INTEL CORP45 citations92
US7166506B2Jan 23, 2007

Poly open polish process

INTEL CORP34 citations92
US7045428B2May 16, 2006

Method for making a semiconductor device with a high-k gate dielectric and a conductor that facilitates current flow across a P/N junction

INTEL CORP20 citations92
US6943121B2Sep 13, 2005

Selectively converted inter-layer dielectric

INTEL CORP43 citations92
US6908863B2Jun 21, 2005

Sacrificial dielectric planarization layer

INTEL CORP24 citations92
US7422936B2Sep 9, 2008

Facilitating removal of sacrificial layers via implantation to form replacement metal gates

INTEL CORP39 citations90
US7754552B2Jul 13, 2010

Preventing silicide formation at the gate electrode in a replacement metal gate technology

INTEL CORP8 citations84
US7671471B2Mar 2, 2010

Method for making a semiconductor device having a high-k dielectric layer and a metal gate electrode

INTEL CORP8 citations84
US6705928B1Mar 16, 2004

Through-pad slurry delivery for chemical-mechanical polish

INTEL CORP15 citations84
US7144816B2Dec 5, 2006

Polysilicon opening polish

INTEL CORP6 citations74
US7109557B2Sep 19, 2006

Sacrificial dielectric planarization layer

INTEL CORP6 citations74
US7883951B2Feb 8, 2011

CMOS device with metal and silicide gate electrodes and a method for making it

INTEL CORP3 citations63
US7239019B2Jul 3, 2007

Selectively converted inter-layer dielectric

INTEL CORP2 citations62
US7666465B2Feb 23, 2010

Introducing nanotubes in trenches and structures formed thereby

INTEL CORP1 citations52
US7205236B2Apr 17, 2007

Semiconductor substrate polishing methods and equipment

INTEL CORP0 citations52

NASA

1 patent

INTEGRATED PROCESS EQUIPMENT C

1 patent

KAVALIEROS JACK

1 patent

SPEEDFAM IPEC CORP

1 patent