Inventor

JAEHNKE TORSTEN

DE7 patents

⚠️ This page may combine multiple inventors who share the name “JAEHNKE TORSTEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JPK INSTRUMENTS AG

5 patents

US7022985B2Apr 4, 2006

Apparatus and method for a scanning probe microscope

JPK INSTRUMENTS AG122 citations96

US8381311B2Feb 19, 2013

Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system

JPK INSTRUMENTS AG6 citations70

US7473894B2Jan 6, 2009

Apparatus and method for a scanning probe microscope

JPK INSTRUMENTS AG4 citations60

US7934323B2May 3, 2011

Method and a device for the positioning of a displaceable component in an examining system

JPK INSTRUMENTS AG0 citations49

US7971266B2Jun 28, 2011

Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope

JPK INSTRUMENTS AG0 citations46

HEYN SVEN-PETER

1 patent

US8415613B2Apr 9, 2013

Method and apparatus for characterizing a sample with two or more optical traps

HEYN SVEN-PETER26 citations82

JAEHNKE TORSTEN

1 patent

US8505109B2Aug 6, 2013

Measuring probe device for a probe microscope, measuring cell and scanning probe microscope

JAEHNKE TORSTEN0 citations41