Inventor
OSHIMA HIDEYUKI
JP7 patents
Patents
7 patentsUS7187192B2Mar 6, 2007
Semiconductor test device having clock recovery circuit
ADVANTEST CORP13 citations81
US6956395B2Oct 18, 2005
Tester for testing an electronic device using oscillator and frequency divider
ADVANTEST CORP13 citations81
US7330045B2Feb 12, 2008
Semiconductor test apparatus
ADVANTEST CORP6 citations71
US7196534B2Mar 27, 2007
Semiconductor test instrument
ADVANTEST CORP7 citations71
US11275104B2Mar 15, 2022
Test apparatus
ADVANTEST CORP2 citations67
US7078889B2Jul 18, 2006
Semiconductor test apparatus for testing semiconductor device that produces output data by its internal clock timing
ADVANTEST CORP6 citations60
US7444576B2Oct 28, 2008
Target value search circuit, taget value search method, and semiconductor test device using the same
ADVANTEST CORP0 citations49