P

Inventor

KHAKIFIROOZ ALI

US759 patents
⚠️ This page may combine multiple inventors who share the name “KHAKIFIROOZ ALI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

40 patents
US8969934B1Mar 3, 2015

Gate-all-around nanowire MOSFET and method of formation

IBM326 citations99
US9659963B2May 23, 2017

Contact formation to 3D monolithic stacked FinFETs

IBM79 citations98
US9455331B1Sep 27, 2016

Method and structure of forming controllable unmerged epitaxial material

IBM66 citations98
US9356027B1May 31, 2016

Dual work function integration for stacked FinFET

IBM40 citations98
US9312383B1Apr 12, 2016

Self-aligned contacts for vertical field effect transistors

IBM55 citations98
US9293459B1Mar 22, 2016

Method and structure for improving finFET with epitaxy source/drain

IBM54 citations98
US9219154B1Dec 22, 2015

Method of fabricating electrostatically enhanced fins and stacked nanowire field effect transistors

IBM46 citations98
US9196479B1Nov 24, 2015

Method of co-integration of strained silicon and strained germanium in semiconductor devices including fin structures

IBM40 citations98
US8900951B1Dec 2, 2014

Gate-all-around nanowire MOSFET and method of formation

IBM38 citations98
US8822320B2Sep 2, 2014

Dense finFET SRAM

IBM38 citations98
US8796093B1Aug 5, 2014

Doping of FinFET structures

IBM71 citations98
US7993999B2Aug 9, 2011

High-K/metal gate CMOS finFET with improved pFET threshold voltage

IBM111 citations98
US9659942B1May 23, 2017

Selective epitaxy growth for semiconductor devices with fin field-effect transistors (FinFET)

IBM22 citations94
US9472628B2Oct 18, 2016

Heterogeneous source drain region and extension region

IBM31 citations94
US9437502B1Sep 6, 2016

Method to form stacked germanium nanowires and stacked III-V nanowires

IBM29 citations94
US9318553B1Apr 19, 2016

Nanowire device with improved epitaxy

IBM25 citations94
US9257527B2Feb 9, 2016

Nanowire transistor structures with merged source/drain regions using auxiliary pillars

IBM36 citations94
US9093533B2Jul 28, 2015

FinFET structures having silicon germanium and silicon channels

IBM33 citations94
US8951870B2Feb 10, 2015

Forming strained and relaxed silicon and silicon germanium fins on the same wafer

IBM39 citations94
US8653599B1Feb 18, 2014

Strained SiGe nanowire having (111)-oriented sidewalls

IBM39 citations94
US9721885B2Aug 1, 2017

Electrical fuse and/or resistor structures

IBM7 citations93
US9716064B2Jul 25, 2017

Electrical fuse and/or resistor structures

IBM7 citations93
US9660050B1May 23, 2017

Replacement low-k spacer

IBM14 citations93
US9627270B2Apr 18, 2017

Dual work function integration for stacked FinFET

IBM15 citations93
US9455250B1Sep 27, 2016

Distributed decoupling capacitor

IBM12 citations93
US9431296B2Aug 30, 2016

Structure and method to form liner silicide with improved contact resistance and reliablity

IBM22 citations93
US9397094B2Jul 19, 2016

Semiconductor structure with an L-shaped bottom plate

IBM13 citations93
US9379204B2Jun 28, 2016

Lattice matched aspect ratio trapping to reduce defects in III-V layer directly grown on silicon

IBM16 citations93
US9362285B2Jun 7, 2016

Structure and method to increase contact area in unmerged EPI integration for CMOS FinFETs

IBM23 citations93
US9269627B1Feb 23, 2016

Fin cut on SIT level

IBM16 citations93
US9064698B1Jun 23, 2015

Thin-film gallium nitride structures grown on graphene

IBM25 citations93
US9040363B2May 26, 2015

FinFET with reduced capacitance

IBM12 citations93
US8993399B2Mar 31, 2015

FinFET structures having silicon germanium and silicon fins

IBM25 citations93
US8987069B1Mar 24, 2015

Semiconductor substrate with multiple SiGe regions having different germanium concentrations by a single epitaxy process

IBM24 citations93
US8987790B2Mar 24, 2015

Fin isolation in multi-gate field effect transistors

IBM22 citations93
US8987823B2Mar 24, 2015

Method and structure for forming a localized SOI finFET

IBM20 citations93
US8981493B2Mar 17, 2015

FinFET and method of fabrication

IBM17 citations93
US8946007B2Feb 3, 2015

Inverted thin channel mosfet with self-aligned expanded source/drain

IBM17 citations93
US8895381B1Nov 25, 2014

Method of co-integration of strained-Si and relaxed Si or strained SiGe FETs on insulator with planar and non-planar architectures

IBM25 citations93
US8878311B2Nov 4, 2014

Integrated circuit having raised source drains devices with reduced silicide contact resistance and methods to fabricate same

IBM20 citations93

GLOBALFOUNDRIES INC

4 patents

INTEL CORP

2 patents

BEDELL STEPHEN W

1 patent

XIE RUILONG

1 patent

ADAM THOMAS N

1 patent

BASKER VEERARAGHAVAN S

1 patent

Showing the top 50 of 759 patents by PatentIndex Score.