Inventor
HOUGE ERIK C
US9 patents
⚠️ This page may combine multiple inventors who share the name “HOUGE ERIK C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AGERE SYSTEMS INC
6 patentsUS7972440B2Jul 5, 2011
Monitoring and control of a fabrication process
AGERE SYSTEMS INC10 citations80
US6727720B2Apr 27, 2004
Probe having a microstylet
AGERE SYSTEMS INC14 citations80
US6870950B2Mar 22, 2005
Method for detecting defects in a material and a system for accomplishing the same
AGERE SYSTEMS INC7 citations67
US6577970B2Jun 10, 2003
Method of determining a crystallographic quality of a material located on a substrate
AGERE SYSTEMS INC5 citations60
US7342225B2Mar 11, 2008
Crystallographic metrology and process control
AGERE SYSTEMS INC3 citations54
US6627885B1Sep 30, 2003
Method of focused ion beam pattern transfer using a smart dynamic template
AGERE SYSTEMS INC0 citations50
AGERE SYST GUARDIAN CORP
2 patentsUS6250143B1Jun 26, 2001
Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-section
AGERE SYST GUARDIAN CORP50 citations90
US6425189B1Jul 30, 2002
Probe tip locator having improved marker arrangement for reduced bit encoding error
AGERE SYST GUARDIAN CORP0 citations50