Inventor
YEH CHIUNG-HAN
TW41 patents
⚠️ This page may combine multiple inventors who share the name “YEH CHIUNG-HAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
18 patentsUS9922903B2Mar 20, 2018
Interconnect structure for package-on-package devices and a method of fabricating
TAIWAN SEMICONDUCTOR MFG CO LTD12 citations93
US9460987B2Oct 4, 2016
Interconnect structure for package-on-package devices and a method of fabricating
TAIWAN SEMICONDUCTOR MFG CO LTD22 citations93
US11581250B2Feb 14, 2023
Package with metal-insulator-metal capacitor and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations86
US11037861B2Jun 15, 2021
Interconnect structure for package-on-package devices
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US10515875B2Dec 24, 2019
Interconnect structure for package-on-package devices
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations84
US10269685B2Apr 23, 2019
Interconnect structure for package-on-package devices
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10971441B2Apr 6, 2021
Package with metal-insulator-metal capacitor and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10658492B2May 19, 2020
Polysilicon design for replacement gate technology
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10403736B2Sep 3, 2019
Polysilicon design for replacement gate technology
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10153205B2Dec 11, 2018
Package with metal-insulator-metal capacitor and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10084061B2Sep 25, 2018
Polysilicon design for replacement gate technology
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US9929251B2Mar 27, 2018
Polysilicon design for replacement gate technology
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US9679988B2Jun 13, 2017
Polysilicon design for replacement gate technology
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US12426333B2Sep 23, 2025
Polysilicon design for replacement gate technology
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11018241B2May 25, 2021
Polysilicon design for replacement gate technology
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10475731B2Nov 12, 2019
Package with metal-insulator-metal capacitor and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10276484B2Apr 30, 2019
Package with metal-insulator-metal capacitor and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9455344B2Sep 27, 2016
Integrated circuit metal gate structure having tapered profile
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
TAIWAN SEMICONDUCTOR MFG
10 patentsUS9263511B2Feb 16, 2016
Package with metal-insulator-metal capacitor and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG1,003 citations99
US9048222B2Jun 2, 2015
Method of fabricating interconnect structure for package-on-package devices
TAIWAN SEMICONDUCTOR MFG1,081 citations99
US8035165B2Oct 11, 2011
Integrating a first contact structure in a gate last process
TAIWAN SEMICONDUCTOR MFG25 citations93
US8039381B2Oct 18, 2011
Photoresist etch back method for gate last process
TAIWAN SEMICONDUCTOR MFG33 citations92
US9040381B2May 26, 2015
Packages with passive devices and methods of forming the same
TAIWAN SEMICONDUCTOR MFG11 citations84
US8048752B2Nov 1, 2011
Spacer shape engineering for void-free gap-filling process
TAIWAN SEMICONDUCTOR MFG9 citations84
US7927943B2Apr 19, 2011
Method for tuning a work function of high-k metal gate devices
TAIWAN SEMICONDUCTOR MFG7 citations84
US8932951B2Jan 13, 2015
Dishing-free gap-filling with multiple CMPs
TAIWAN SEMICONDUCTOR MFG4 citations73
US9263396B2Feb 16, 2016
Photo alignment mark for a gate last process
TAIWAN SEMICONDUCTOR MFG2 citations63
US8669153B2Mar 11, 2014
Integrating a first contact structure in a gate last process
TAIWAN SEMICONDUCTOR MFG0 citations52
YEH CHIUNG-HAN
3 patentsUS8105891B2Jan 31, 2012
Method for tuning a work function of high-K metal gate devices
YEH CHIUNG-HAN124 citations98
US8093120B2Jan 10, 2012
Integrating a first contact structure in a gate last process
YEH CHIUNG-HAN21 citations92
US8394692B2Mar 12, 2013
Integrating a first contact structure in a gate last process
YEH CHIUNG-HAN3 citations62