Inventor

WU HAN-WEI

TW22 patents

⚠️ This page may combine multiple inventors who share the name “WU HAN-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WU HAN-WEI

TAIWAN SEMICONDUCTOR MFG CO LTD

Semiconductor component and fabricating method thereof

Method of manufacturing semiconductor devices

Gate formation with varying work function layers

Method of pulling-back sidewall metal layer

Thin-film non-uniform stress evaluation

Method of making a FinFET device

Loading effect reduction through multiple coat-etch processes

Lithography system having invisible pellicle over mask

Method of manufacturing semiconductor structure with spacer on photoresist layer

Method of manufacturing a semiconductor device

Etch monitoring and performing

Method of manufacturing semiconductor devices

Memory device and manufacturing method thereof

Gate formation with varying work function layers

Etch monitoring and performing

Gate formation with varying work function layers

Method for evaluating non-uniform stress

Loading effect reduction through multiple coat-etch processes

Loading effect reduction through multiple coat-etch processes

Loading effect reduction through multiple coat-etch processes

Memory structure and method of forming the same

TAIWAN SEMICONDUCTOR MFG

Method of making a FinFET device