Inventor
DIEP VINH Q
US5 patents
Patents
5 patentsUS11967387B2Apr 23, 2024
Detrapping electrons to prevent quick charge loss during program verify operations in a memory device
MICRON TECHNOLOGY INC0 citations61
US11508449B2Nov 22, 2022
Detrapping electrons to prevent quick charge loss during program verify operations in a memory device
MICRON TECHNOLOGY INC1 citations61
US12308074B2May 20, 2025
Enhanced gradient seeding scheme during a program operation in a memory sub-system
MICRON TECHNOLOGY INC0 citations60
US12217801B2Feb 4, 2025
Bias voltage schemes during pre-programming and programming phases
MICRON TECHNOLOGY INC0 citations60
US11901010B2Feb 13, 2024
Enhanced gradient seeding scheme during a program operation in a memory sub-system
MICRON TECHNOLOGY INC0 citations60