Inventor

TANIZAKI TETSUSHI

JP27 patents

⚠️ This page may combine multiple inventors who share the name “TANIZAKI TETSUSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TANIZAKI TETSUSHI

MITSUBISHI ELECTRIC CORP

Multi-bank clock synchronous type semiconductor memory device having improved memory array and power supply arrangement

Semiconductor memory device capable of increasing chip yields while maintaining rapid operation

Semiconductor memory device having a circuit for fast operation

Semiconductor integrated circuit device having stable input protection circuit

Semiconductor memory device allowing writing of desired data to a storage node of a defective memory cell

Semiconductor memory device

High speed operable semiconductor memory device with memory blocks arranged about the center

High speed operable semiconductor memory device with memory blocks arranged about the center

Semiconductor memory device that can have power consumption reduced during self refresh mode

Semiconductor memory device including additional memory cell block having irregular memory cell arrangement

Dynamic random access memory device suitable for shortening time required for testing self-refresh function

Semiconductor memory device having a test mode setting circuit

Semiconductor memory device

Semiconductor memory device having a circuit for fast operation

Semiconductor memory device capable of performing stable operation for noise while preventing increase in chip area

Semiconductor memory device storing data and parity bit

Semiconductor integrated circuit having built-in self-test circuit

Semiconductor device having test function

RENESAS TECH CORP

Semiconductor memory device allowing mounting of built-in self test circuit without addition of interface specification

Test circuit capable of testing embedded memory with reliability

Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit device

Semiconductor device including test-facilitating circuit using built-in self test circuit

Semiconductor memory device having a circuit for fast operation

Circuit for reducing test time and semiconductor memory device including the circuit

Semiconductor test circuit for testing a semiconductor memory device having a write mask function

Parallel operational processing device

RYODEN SEMICONDUCTOR SYST ENG

Semiconductor memory device with built-in self test circuit operating at high rate