P

Inventor

OSAWA HISAO

JP23 patents
⚠️ This page may combine multiple inventors who share the name “OSAWA HISAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIKON CORP

16 patents
US7848017B2Dec 7, 2010

Microscope device

NIKON CORP17 citations84
US10649196B2May 12, 2020

Structured illumination microscope, observation method , and control program

NIKON CORP8 citations83
US10983328B2Apr 20, 2021

Structured illumination microscope apparatus and an image forming apparatus

NIKON CORP1 citations72
US9535241B2Jan 3, 2017

Structured illuminating microscopy and structured illuminating observation method

NIKON CORP5 citations72
US9146393B2Sep 29, 2015

Structured illumination apparatus, structured illumination microscopy, and structured illumination method

NIKON CORP4 citations72
US10018552B2Jul 10, 2018

Particle analysis apparatus, observation apparatus, particle analysis program and particle analysis method

NIKON CORP5 citations70
US7969652B2Jun 28, 2011

Microscope device and image processing method

NIKON CORP5 citations62
US7872798B2Jan 18, 2011

Microscopic apparatus and observing method

NIKON CORP4 citations62
US7256890B2Aug 14, 2007

Spectroscope and microspectroscope equipped therewith

NIKON CORP4 citations62
US10502945B2Dec 10, 2019

Structured illumination microscope apparatus and an image forming apparatus

NIKON CORP0 citations51
US10228552B2Mar 12, 2019

Structured illuminating microscopy and structured illuminating observation method

NIKON CORP0 citations51
US10900900B2Jan 26, 2021

Structured illumination microscope, observation method, and storage medium

NIKON CORP0 citations50
US10126113B2Nov 13, 2018

Spectroscope and microspectroscopic system

NIKON CORP0 citations49
US9612156B2Apr 4, 2017

Spectroscope and microspectroscopic system

NIKON CORP0 citations49
US9243955B2Jan 26, 2016

Spectroscope and microspectroscopic system

NIKON CORP0 citations49
US10067331B2Sep 4, 2018

Structured illumination microscope device

NIKON CORP0 citations40

OSAWA HISAO

2 patents

UNIV TOKYO

2 patents

OUCHI YUMIKO

1 patent

TERAKAWA SUSUMU

1 patent

BAYER AG

1 patent