Inventor
ROOT BRYAN J
US44 patents
⚠️ This page may combine multiple inventors who share the name “ROOT BRYAN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CELADON SYSTEMS INC
35 patentsUS6586954B2Jul 1, 2003
Probe tile for probing semiconductor wafer
CELADON SYSTEMS INC54 citations96
US6201402B1Mar 13, 2001
Probe tile and platform for large area wafer probing
CELADON SYSTEMS INC49 citations96
US6992495B2Jan 31, 2006
Shielded probe apparatus for probing semiconductor wafer
CELADON SYSTEMS INC15 citations92
US6975128B1Dec 13, 2005
Electrical, high temperature test probe with conductive driven guard
CELADON SYSTEMS INC23 citations92
US6963207B2Nov 8, 2005
Apparatus and method for terminating probe apparatus of semiconductor wafer
CELADON SYSTEMS INC39 citations92
US6882168B2Apr 19, 2005
Probe tile for probing semiconductor wafer
CELADON SYSTEMS INC23 citations92
USD639757SJun 14, 2011
Top contact layout board in an electrical system
CELADON SYSTEMS INC15 citations84
USD639755SJun 14, 2011
Top contact layout board in an electrical system
CELADON SYSTEMS INC8 citations84
US7768282B2Aug 3, 2010
Apparatus and method for terminating probe apparatus of semiconductor wafer
CELADON SYSTEMS INC5 citations74
US7728609B2Jun 1, 2010
Replaceable probe apparatus for probing semiconductor wafer
CELADON SYSTEMS INC6 citations74
US7626404B2Dec 1, 2009
Replaceable probe apparatus for probing semiconductor wafer
CELADON SYSTEMS INC6 citations74
US7345494B2Mar 18, 2008
Probe tile for probing semiconductor wafer
CELADON SYSTEMS INC7 citations74
US7170305B2Jan 30, 2007
Apparatus and method for terminating probe apparatus of semiconductor wafer
CELADON SYSTEMS INC6 citations74
US7148710B2Dec 12, 2006
Probe tile for probing semiconductor wafer
CELADON SYSTEMS INC6 citations74
US9726694B2Aug 8, 2017
Test systems with a probe apparatus and index mechanism
CELADON SYSTEMS INC2 citations73
US11275106B2Mar 15, 2022
High voltage probe card system
CELADON SYSTEMS INC2 citations67
US9279829B2Mar 8, 2016
Apparatus and method for terminating probe apparatus of semiconductor wafer
CELADON SYSTEMS INC1 citations63
US7956629B2Jun 7, 2011
Probe tile for probing semiconductor wafer
CELADON SYSTEMS INC1 citations63
US7786743B2Aug 31, 2010
Probe tile for probing semiconductor wafer
CELADON SYSTEMS INC3 citations63
US7545157B2Jun 9, 2009
Shielded probe apparatus for probing semiconductor wafer
CELADON SYSTEMS INC1 citations63
US7271607B1Sep 18, 2007
Electrical, high temperature test probe with conductive driven guard
CELADON SYSTEMS INC1 citations63
US7259577B2Aug 21, 2007
Shielded probe apparatus for probing semiconductor wafer
CELADON SYSTEMS INC4 citations63
US11313902B2Apr 26, 2022
Modular rail systems, rail systems, mechanisms, and equipment for devices under test
CELADON SYSTEMS INC0 citations62
US10976347B2Apr 13, 2021
Magnet extension
CELADON SYSTEMS INC0 citations62
US10261124B2Apr 16, 2019
Modular rail systems, rail systems, mechanisms, and equipment for devices under test
CELADON SYSTEMS INC1 citations62
USD713363SSep 16, 2014
Support for a probe test core
CELADON SYSTEMS INC3 citations59
US10620262B2Apr 14, 2020
Modular rail systems, rail systems, mechanisms, and equipment for devices under test
CELADON SYSTEMS INC0 citations52
US10254309B2Apr 9, 2019
Test apparatus having a probe core with a latch mechanism
CELADON SYSTEMS INC0 citations52
US10145863B2Dec 4, 2018
Test systems with a probe apparatus and index mechanism
CELADON SYSTEMS INC0 citations52
US9910067B2Mar 6, 2018
Apparatus and method for terminating probe apparatus of semiconductor wafer
CELADON SYSTEMS INC0 citations52
US9678149B2Jun 13, 2017
Test apparatus having a probe core with a twist lock mechanism
CELADON SYSTEMS INC0 citations52
US8354856B2Jan 15, 2013
Replaceable probe apparatus for probing semiconductor wafer
CELADON SYSTEMS INC0 citations52
US7999564B2Aug 16, 2011
Replaceable probe apparatus for probing semiconductor wafer
CELADON SYSTEMS INC0 citations52
US7659737B1Feb 9, 2010
Electrical, high temperature test probe with conductive driven guard
CELADON SYSTEMS INC0 citations52
USD722031SFeb 3, 2015
Top contact layout board in an electrical system
CELADON SYSTEMS INC0 citations49
ROOT BRYAN J
8 patentsUS8674715B2Mar 18, 2014
Test apparatus having a probe core with a twist lock mechanism
ROOT BRYAN J6 citations83
US8149009B2Apr 3, 2012
Apparatus and method for terminating probe apparatus of semiconductor wafer
ROOT BRYAN J4 citations73
US9018966B2Apr 28, 2015
Test apparatus having a probe card and connector mechanism
ROOT BRYAN J3 citations62
US8994390B2Mar 31, 2015
Test systems with a probe apparatus and index mechanism
ROOT BRYAN J3 citations62
US8860450B2Oct 14, 2014
Apparatus and method for terminating probe apparatus of semiconductor wafer
ROOT BRYAN J3 citations62
USD654033SFeb 14, 2012
Grooved wire support for a probe test core
ROOT BRYAN J5 citations62
US9024651B2May 5, 2015
Test apparatus having a probe card and connector mechanism
ROOT BRYAN J3 citations60
US8698515B2Apr 15, 2014
Probe test equipment for testing a semiconductor device
ROOT BRYAN J0 citations51