Inventor
TIEMEIJER PETER CHRISTIAAN
NL41 patents
⚠️ This page may combine multiple inventors who share the name “TIEMEIJER PETER CHRISTIAAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FEI CO
33 patentsUS6693282B1Feb 17, 2004
Particle-optical apparatus including a particle source that can be switched between high brightness and large beam current
FEI CO26 citations92
US10224174B1Mar 5, 2019
Transmission charged particle microscope with imaging beam rotation
FEI CO18 citations84
US6593584B2Jul 15, 2003
Multi-beam lithography apparatus with mutually different beam limiting apertures
FEI CO19 citations83
US7915584B2Mar 29, 2011
TEM with aberration corrector and phase plate
FEI CO19 citations82
US11955310B2Apr 9, 2024
Transmission charged particle microscope with an electron energy loss spectroscopy detector
FEI CO3 citations75
US10559448B2Feb 11, 2020
Transmission charged particle microscope with improved EELS/EFTEM module
FEI CO2 citations73
US10522323B2Dec 31, 2019
Electron energy loss spectroscopy with adjustable energy resolution
FEI CO2 citations73
US9978561B2May 22, 2018
Post column filter with enhanced energy range
FEI CO2 citations73
US10410827B2Sep 10, 2019
Gun lens design in a charged particle microscope
FEI CO2 citations72
US11114271B2Sep 7, 2021
Sixth-order and above corrected STEM multipole correctors
FEI CO3 citations71
US10453647B2Oct 22, 2019
Emission noise correction of a charged particle source
FEI CO4 citations71
US11587759B2Feb 21, 2023
Method, device and system for reducing off-axial aberration in electron microscopy
FEI CO2 citations69
US10923308B1Feb 16, 2021
Method and system for energy resolved chroma imaging
FEI CO2 citations69
US10832901B2Nov 10, 2020
EELS detection technique in an electron microscope
FEI CO3 citations69
US9934936B2Apr 3, 2018
Charged particle microscope with special aperture plate
FEI CO4 citations69
US9524851B2Dec 20, 2016
Method of performing spectroscopy in a transmission charged-particle microscope
FEI CO3 citations67
US12505996B2Dec 23, 2025
EELS auto-alignment using full image simulation
FEI CO0 citations62
US12255045B2Mar 18, 2025
Transmission charged particle microscope with an electron energy loss spectroscopy detector
FEI CO0 citations62
US10971326B2Apr 6, 2021
Multi-electron-beam imaging apparatus with improved performance
FEI CO1 citations60
US8766214B2Jul 1, 2014
Method of preparing and imaging a lamella in a particle-optical apparatus
FEI CO3 citations60
US12176179B2Dec 24, 2024
Method, device and system for reducing off-axial aberration in electron microscopy
FEI CO0 citations59
US11817290B2Nov 14, 2023
Method, device and system for reducing off-axial aberration in electron microscopy
FEI CO0 citations59
US9136087B2Sep 15, 2015
Method of investigating and correcting aberrations in a charged-particle lens system
FEI CO3 citations59
US11988618B2May 21, 2024
Method and system to determine crystal structure
FEI CO0 citations56
US11948771B2Apr 2, 2024
Method of determining an energy width of a charged particle beam
FEI CO0 citations52
US11024483B2Jun 1, 2021
Transmission charged particle microscope with adjustable beam energy spread
FEI CO0 citations52
US10431420B2Oct 1, 2019
Post column filter with enhanced energy range
FEI CO0 citations52
US11450505B2Sep 20, 2022
Magnetic field free sample plane for charged particle microscope
FEI CO0 citations51
US12100585B2Sep 24, 2024
Energy spectrometer with dynamic focus
FEI CO0 citations47
US11804357B2Oct 31, 2023
Electron optical module for providing an off-axial electron beam with a tunable coma
FEI CO0 citations46
US9991087B2Jun 5, 2018
Spectroscopy in a transmission charged-particle microscope
FEI CO1 citations46
US10157727B2Dec 18, 2018
Aberration measurement in a charged particle microscope
FEI CO0 citations42
US9570270B2Feb 14, 2017
Method of using an environmental transmission electron microscope
FEI CO0 citations39