Inventor

KURODA RYO

JP90 patents

⚠️ This page may combine multiple inventors who share the name “KURODA RYO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KURODA RYO

CANON KK

Near-field optical probe having surface plasmon polariton waveguide and method of preparing the same as well as microscope, recording/regeneration apparatus and micro-fabrication apparatus using the same

Optical probe for detecting or irradiating light and near-field optical microscope having such probe and manufacturing method of such probe

Exposure method and exposure apparatus

Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufacturing the probe

Information recording/reproducing method for recording and/or reproducing information on information recording carrier by use of probe electrode

Light modulation apparatus and optical switch, movement detecting device and distance measuring device, alignment device and semiconductor aligner, and processes thereof

Probe having micro-projection and manufacturing method thereof

Optical probe having a refractive index micro-lens and method of manufacturing the same

Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufacturing the probe

Mask for evanescent light exposure, object to be exposed and apparatus using same

Method and producing probe with minute aperture, scanning near-field optical microscope using the probe and recording and/or reproducing apparatus using the probe

Method of detecting positional displacement between mask and wafer, and exposure apparatus adopting the method

Information recording/reproducing method, recording carrier and apparatus for recording and/or reproducing information on information recording carrier by use of probe electrode

Information recording and reproducing apparatus for recording and reproducing information by using a probe electrode

Information recording/reproducing apparatus for recording/reproducing information with probes

Information detection apparatus and displacement information measurement apparatus

Information processing device and information processing method

Device for detecting positional relationship between two objects

Information recording and/or reproducing apparatus

Micro-displacement type information detection probe device and scanning tunneling microscope, atomic force microscope, information processing device by use thereof

Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit

Probe for irradiating with or detecting light and method for manufacturing the same

Scanning near-field optical microscope using the probe and recording and/or reproducing apparatus using the probe

Recording/reproducing apparatus and method for recording/reproducing information using probe

Information processing apparatus with mechanism for adjusting interval between substrate for supporting a plurality of probes and recording medium

Information recording and/or reproducing apparatus using probe

Recording and reading space control between a read/write probe and a recording medium

Atomic force microscope with a plurality of cantilevers for recording/reproducing information

Accessing method, and information processing method and information processing device utilizing the same

Information recording medium, and information recording and/or reproducing method and apparatus

Position detecting device employing marks and oblique projection

Distance measuring system

Chemical sensor

Near-field exposure photoresist and fine pattern forming method using the same

Near field light probe, near field optical microscope, near field light lithography apparatus, and near field light storage apparatus that have the near field light probe

Exposure method and exposure apparatus using near-field light and exposure mask

Pattern-forming method using photomask, and pattern-forming apparatus

Pattern forming apparatus and pattern forming method

Information processing apparatus provided with surface aligning mechanism between probe head substrate and recording medium substrate

Optical filter

Sensor device and testing method utilizing localized plasmon resonance

Near-field light generating structure, near-field exposure mask, and near-field generating method

Near-field light exposure mask with avoidance of overlap of near-field light, method for manufacturing the same, exposure apparatus and method using near-field light exposure mask, and method for manufacturing device

Method for forming a micro-pattern

Near-field exposure method

Exposure apparatus and method

Probe with hollow waveguide and method for producing the same

Probe with hollow waveguide and method for producing the same

Exposure method and apparatus using near field light

YAMADA TOMOHIRO

Optical filter