Inventor

LIIKANEN BRUCE A

US143 patents

⚠️ This page may combine multiple inventors who share the name “LIIKANEN BRUCE A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LIIKANEN BRUCE A

MICRON TECHNOLOGY INC

Memory device with dynamic program-verify voltage calibration

Memory device with dynamic program-verify voltage calibration

Memory device with dynamic processing level calibration

Memory quality monitor based compensation method and apparatus

Memory device with dynamic program-verify voltage calibration

Performing threshold voltage offset bin selection by package for memory devices

Enhanced block management for a memory sub-system

Memory sub-system with dynamic calibration using component-based function(s)

Memory sub-system with background scan and histogram statistics

Dynamic programing of valley margins of a memory cell

Memory characterization and sub-system modification

First-pass dynamic program targeting (DPT)

Offset memory component automatic calibration (AUTOCAL) error recovery for a memory sub-system

Automatic calibration (autocal) error recovery for a memory sub-system

Memory device with dynamic programming calibration

Generation and application of gray codes

Block family-based error avoidance for memory devices

Open block family duration limited by time and temperature

Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distribution

Memory sub-system with dynamic calibration using component-based function(s)

Open block family duration limited by temperature variation

Enhanced block management for a memory subsystem

Offset memory component automatic calibration (autocal) error recovery for a memory sub-system

Error-handling flows in memory devices based on bins

Memory sub-system with dynamic calibration using component-based function(s)

Generating embedded data in memory cells in a memory sub-system

Voltage bin boundary calibration at memory device power up

Dynamic program erase targeting with bit error rate

Dynamic temperature compensation in a memory component

Offset memory component automatic calibration (autocal) error recovery for a memory subsystem

Memory device with dynamic processing level calibration

Write data for bin resynchronization after power loss

Block family-based error avoidance for memory devices

Read level calibration in memory devices using embedded servo cells

SEAGATE TECHNOLOGY LLC

Methods and structure for recovery of write fault errors in a dynamically mapped mass storage device

Methods and structure for on-the-fly head depopulation in a dynamically mapped mass storage device

Methods and structure for dynamic appended metadata in a dynamically mapped mass storage device

Methods and structure for field flawscan in a dynamically mapped mass storage device

Methods and structure for dynamic data density in a dynamically mapped mass storage device

Methods and structure for dynamic multiple indirections in a dynamically mapped mass storage device

Methods and structure for writing lead-in sequences for head stability in a dynamically mapped mass storage device

MAXTOR CORP

Efficient drive-level estimation of written-in servo position error

Method and apparatus for writing and reading servo information written in a spiral fashion

Method and apparatus for runout correction by proper positioning of servo data while self-servo writing

Transducer head with separate data and servo read elements

Programmable, variable data track pitch

Methods and apparatuses for writing spiral servo patterns onto a disk surface

Disk drive with compensation values calculated using a non-causal impulse response

LIIKANEN BRUCE A

Memory quality monitor based compensation method and apparatus

Bitwise operations and apparatus in a multi-level system