Inventor
LIANG MING-CHUNG
TW51 patents
⚠️ This page may combine multiple inventors who share the name “LIANG MING-CHUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
25 patentsUS9123656B1Sep 1, 2015
Organosilicate polymer mandrel for self-aligned double patterning process
TAIWAN SEMICONDUCTOR MFG CO LTD45 citations94
US9425049B2Aug 23, 2016
Cut first self-aligned litho-etch patterning
TAIWAN SEMICONDUCTOR MFG CO LTD14 citations92
US9368349B2Jun 14, 2016
Cut last self-aligned litho-etch patterning
TAIWAN SEMICONDUCTOR MFG CO LTD20 citations92
US9406511B2Aug 2, 2016
Self-aligned double patterning
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US10522468B2Dec 31, 2019
Interconnect structure and method
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations82
US11037789B2Jun 15, 2021
Cut last self-aligned litho-etch patterning
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10553431B2Feb 4, 2020
Cut last self-aligned litho-etch patterning
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10269700B2Apr 23, 2019
Interconnect structure and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10256096B2Apr 9, 2019
Self-aligned double patterning
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10109486B2Oct 23, 2018
Cut first self-aligned litho-etch patterning
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9698016B2Jul 4, 2017
Cut first self-aligned litho-etch patterning
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9953863B1Apr 24, 2018
Methods of forming an interconnect structure
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US9728445B2Aug 8, 2017
Method for forming conducting via and damascene structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11251127B2Feb 15, 2022
Interconnect structure with vias extending through multiple dielectric layers
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US10290535B1May 14, 2019
Integrated circuit fabrication with a passivation agent
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations71
US9761451B2Sep 12, 2017
Cut last self-aligned litho-etch patterning
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US11521857B2Dec 6, 2022
Cut first self-aligned litho-etch patterning
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9917048B2Mar 13, 2018
Interconnect structure and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12444687B2Oct 14, 2025
Interconnect structure with vias extending through multiple dielectric layers
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12293944B2May 6, 2025
Semiconductor device with self-aligned vias
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11502001B2Nov 15, 2022
Semiconductor device with self-aligned vias
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11018021B2May 25, 2021
Curing photo resist for improving etching selectivity
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US10157775B2Dec 18, 2018
Method for manufacturing a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US10090167B2Oct 2, 2018
Semiconductor device and method of forming same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10347505B2Jul 9, 2019
Curing photo resist for improving etching selectivity
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
MACRONIX INT CO LTD
15 patentsUS6750150B2Jun 15, 2004
Method for reducing dimensions between patterns on a photoresist
MACRONIX INT CO LTD58 citations95
US6774051B2Aug 10, 2004
Method for reducing pitch
MACRONIX INT CO LTD36 citations91
US7030459B2Apr 18, 2006
Three-dimensional memory structure and manufacturing method thereof
MACRONIX INT CO LTD13 citations84
US6511902B1Jan 28, 2003
Fabrication method for forming rounded corner of contact window and via by two-step light etching technique
MACRONIX INT CO LTD13 citations83
US7105099B2Sep 12, 2006
Method of reducing pattern pitch in integrated circuits
MACRONIX INT CO LTD9 citations73
US7033948B2Apr 25, 2006
Method for reducing dimensions between patterns on a photoresist
MACRONIX INT CO LTD9 citations73
US6601596B2Aug 5, 2003
Apparatus for cleaning a wafer with shearing stress from slab with curved portion
MACRONIX INT CO LTD8 citations73
US6491046B2Dec 10, 2002
Vertical batch type wafer cleaning apparatus
MACRONIX INT CO LTD6 citations63
US7361604B2Apr 22, 2008
Method for reducing dimensions between patterns on a hardmask
MACRONIX INT CO LTD4 citations62
US6492214B2Dec 10, 2002
Method of fabricating an insulating layer
MACRONIX INT CO LTD3 citations62
US6350660B1Feb 26, 2002
Process for forming a shallow trench isolation
MACRONIX INT CO LTD4 citations60
US7303995B2Dec 4, 2007
Method for reducing dimensions between patterns on a photoresist
MACRONIX INT CO LTD0 citations51
US6746970B2Jun 8, 2004
Method of forming a fluorocarbon polymer film on a substrate using a passivation layer
MACRONIX INT CO LTD0 citations51
US6635579B2Oct 21, 2003
Operating method of a semiconductor etcher
MACRONIX INT CO LTD0 citations51
US6573177B1Jun 3, 2003
Protection layer to prevent under-layer damage during deposition
MACRONIX INT CO LTD2 citations51
TAIWAN SEMICONDUCTOR MFG
5 patentsUS8008206B2Aug 30, 2011
Double patterning strategy for contact hole and trench in photolithography
TAIWAN SEMICONDUCTOR MFG21 citations92
US9142453B1Sep 22, 2015
Interconnect structure and method of forming the same
TAIWAN SEMICONDUCTOR MFG12 citations84
US8354346B2Jan 15, 2013
Method for fabricating low-k dielectric and Cu interconnect
TAIWAN SEMICONDUCTOR MFG0 citations52
US7998873B2Aug 16, 2011
Method for fabricating low-k dielectric and Cu interconnect
TAIWAN SEMICONDUCTOR MFG0 citations52
US7670947B2Mar 2, 2010
Metal interconnect structure and process for forming same
TAIWAN SEMICONDUCTOR MFG1 citations52
LIANG MING-CHUNG
2 patentsTSAI HSIN-YI
1 patentHSIEH WEN-KUO
1 patentTSAI CHI-MING
1 patentShowing the top 50 of 51 patents by PatentIndex Score.