P

Inventor

LIANG MING-CHUNG

TW51 patents
⚠️ This page may combine multiple inventors who share the name “LIANG MING-CHUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

25 patents
US9123656B1Sep 1, 2015

Organosilicate polymer mandrel for self-aligned double patterning process

TAIWAN SEMICONDUCTOR MFG CO LTD45 citations94
US9425049B2Aug 23, 2016

Cut first self-aligned litho-etch patterning

TAIWAN SEMICONDUCTOR MFG CO LTD14 citations92
US9368349B2Jun 14, 2016

Cut last self-aligned litho-etch patterning

TAIWAN SEMICONDUCTOR MFG CO LTD20 citations92
US9406511B2Aug 2, 2016

Self-aligned double patterning

TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US10522468B2Dec 31, 2019

Interconnect structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations82
US11037789B2Jun 15, 2021

Cut last self-aligned litho-etch patterning

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10553431B2Feb 4, 2020

Cut last self-aligned litho-etch patterning

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10269700B2Apr 23, 2019

Interconnect structure and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10256096B2Apr 9, 2019

Self-aligned double patterning

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10109486B2Oct 23, 2018

Cut first self-aligned litho-etch patterning

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9698016B2Jul 4, 2017

Cut first self-aligned litho-etch patterning

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9953863B1Apr 24, 2018

Methods of forming an interconnect structure

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US9728445B2Aug 8, 2017

Method for forming conducting via and damascene structure

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11251127B2Feb 15, 2022

Interconnect structure with vias extending through multiple dielectric layers

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US10290535B1May 14, 2019

Integrated circuit fabrication with a passivation agent

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations71
US9761451B2Sep 12, 2017

Cut last self-aligned litho-etch patterning

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US11521857B2Dec 6, 2022

Cut first self-aligned litho-etch patterning

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9917048B2Mar 13, 2018

Interconnect structure and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12444687B2Oct 14, 2025

Interconnect structure with vias extending through multiple dielectric layers

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12293944B2May 6, 2025

Semiconductor device with self-aligned vias

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11502001B2Nov 15, 2022

Semiconductor device with self-aligned vias

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11018021B2May 25, 2021

Curing photo resist for improving etching selectivity

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US10157775B2Dec 18, 2018

Method for manufacturing a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US10090167B2Oct 2, 2018

Semiconductor device and method of forming same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10347505B2Jul 9, 2019

Curing photo resist for improving etching selectivity

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48

MACRONIX INT CO LTD

15 patents
US6750150B2Jun 15, 2004

Method for reducing dimensions between patterns on a photoresist

MACRONIX INT CO LTD58 citations95
US6774051B2Aug 10, 2004

Method for reducing pitch

MACRONIX INT CO LTD36 citations91
US7030459B2Apr 18, 2006

Three-dimensional memory structure and manufacturing method thereof

MACRONIX INT CO LTD13 citations84
US6511902B1Jan 28, 2003

Fabrication method for forming rounded corner of contact window and via by two-step light etching technique

MACRONIX INT CO LTD13 citations83
US7105099B2Sep 12, 2006

Method of reducing pattern pitch in integrated circuits

MACRONIX INT CO LTD9 citations73
US7033948B2Apr 25, 2006

Method for reducing dimensions between patterns on a photoresist

MACRONIX INT CO LTD9 citations73
US6601596B2Aug 5, 2003

Apparatus for cleaning a wafer with shearing stress from slab with curved portion

MACRONIX INT CO LTD8 citations73
US6491046B2Dec 10, 2002

Vertical batch type wafer cleaning apparatus

MACRONIX INT CO LTD6 citations63
US7361604B2Apr 22, 2008

Method for reducing dimensions between patterns on a hardmask

MACRONIX INT CO LTD4 citations62
US6492214B2Dec 10, 2002

Method of fabricating an insulating layer

MACRONIX INT CO LTD3 citations62
US6350660B1Feb 26, 2002

Process for forming a shallow trench isolation

MACRONIX INT CO LTD4 citations60
US7303995B2Dec 4, 2007

Method for reducing dimensions between patterns on a photoresist

MACRONIX INT CO LTD0 citations51
US6746970B2Jun 8, 2004

Method of forming a fluorocarbon polymer film on a substrate using a passivation layer

MACRONIX INT CO LTD0 citations51
US6635579B2Oct 21, 2003

Operating method of a semiconductor etcher

MACRONIX INT CO LTD0 citations51
US6573177B1Jun 3, 2003

Protection layer to prevent under-layer damage during deposition

MACRONIX INT CO LTD2 citations51

TAIWAN SEMICONDUCTOR MFG

5 patents

LIANG MING-CHUNG

2 patents

TSAI HSIN-YI

1 patent

HSIEH WEN-KUO

1 patent

TSAI CHI-MING

1 patent

Showing the top 50 of 51 patents by PatentIndex Score.