Inventor
FAN YUEZHEN
US8 patents
Patents
8 patentsUS6950771B1Sep 27, 2005
Correlation of electrical test data with physical defect data
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Increased usable programmable device dice
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US7363560B1Apr 22, 2008
Circuit for and method of determining the location of a defect in an integrated circuit
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US7227364B1Jun 5, 2007
Test circuit for and method of identifying a defect in an integrated circuit
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US7673270B1Mar 2, 2010
Method and apparatus for compensating an integrated circuit layout for mechanical stress effects
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US7626874B1Dec 1, 2009
Method and apparatus for testing a memory device with a redundant self repair feature
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US7145344B2Dec 5, 2006
Method and circuits for localizing defective interconnect resources in programmable logic devices
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US9417309B1Aug 16, 2016
Test structure and method for calibrating three-dimensional thermography fault isolation tool
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