P

Inventor

STRONG ALVIN W

US29 patents
⚠️ This page may combine multiple inventors who share the name “STRONG ALVIN W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

24 patents
US8053814B2Nov 8, 2011

On-chip embedded thermal antenna for chip cooling

IBM44 citations98
US6750530B1Jun 15, 2004

Semiconductor antifuse with heating element

IBM57 citations96
US6762966B1Jul 13, 2004

Method and circuit to investigate charge transfer array transistor characteristics and aging under realistic stress and its implementation to DRAM MOSFET array transistor

IBM55 citations95
US7096450B2Aug 22, 2006

Enhancement of performance of a conductive wire in a multilayered substrate

IBM41 citations92
US6252275B1Jun 26, 2001

Silicon-on-insulator non-volatile random access memory device

IBM20 citations92
US6603321B2Aug 5, 2003

Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring

IBM49 citations88
US7704847B2Apr 27, 2010

On-chip heater and methods for fabrication thereof and use thereof

IBM9 citations84
US6352902B1Mar 5, 2002

Process of forming a capacitor on a substrate

IBM14 citations84
US7298161B2Nov 20, 2007

Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability

IBM10 citations83
US6159787ADec 12, 2000

Structures and processes for reduced topography trench capacitors

IBM15 citations82
US7315075B2Jan 1, 2008

Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors

IBM8 citations74
US7064414B2Jun 20, 2006

Heater for annealing trapped charge in a semiconductor device

IBM10 citations74
US6088258AJul 11, 2000

Structures for reduced topography capacitors

IBM14 citations74
US7388274B2Jun 17, 2008

Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors

IBM4 citations63
US7023041B2Apr 4, 2006

Trench capacitor vertical structure

IBM6 citations63
US6333239B1Dec 25, 2001

Processes for reduced topography capacitors

IBM2 citations63
US7868640B2Jan 11, 2011

Array-based early threshold voltage recovery characterization measurement

IBM6 citations62
US7723200B2May 25, 2010

Electrically tunable resistor and related methods

IBM5 citations61
US7512506B2Mar 31, 2009

IC chip stress testing

IBM5 citations59
US7791169B2Sep 7, 2010

Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors

IBM0 citations52
US7511378B2Mar 31, 2009

Enhancement of performance of a conductive wire in a multilayered substrate

IBM0 citations51
US6891359B2May 10, 2005

Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability

IBM1 citations51
US8018017B2Sep 13, 2011

Thermo-mechanical cleavable structure

IBM1 citations49
US9404960B2Aug 2, 2016

On chip bias temperature instability characterization of a semiconductor device

IBM0 citations42

AGARWAL KANAK B

2 patents

CANNON ETHAN H

1 patent

IBEN ICHO E T

1 patent

CHEN FEN

1 patent