Inventor
STRONG ALVIN W
US29 patents
⚠️ This page may combine multiple inventors who share the name “STRONG ALVIN W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
24 patentsUS8053814B2Nov 8, 2011
On-chip embedded thermal antenna for chip cooling
IBM44 citations98
US6750530B1Jun 15, 2004
Semiconductor antifuse with heating element
IBM57 citations96
US6762966B1Jul 13, 2004
Method and circuit to investigate charge transfer array transistor characteristics and aging under realistic stress and its implementation to DRAM MOSFET array transistor
IBM55 citations95
US7096450B2Aug 22, 2006
Enhancement of performance of a conductive wire in a multilayered substrate
IBM41 citations92
US6252275B1Jun 26, 2001
Silicon-on-insulator non-volatile random access memory device
IBM20 citations92
US6603321B2Aug 5, 2003
Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring
IBM49 citations88
US7704847B2Apr 27, 2010
On-chip heater and methods for fabrication thereof and use thereof
IBM9 citations84
US6352902B1Mar 5, 2002
Process of forming a capacitor on a substrate
IBM14 citations84
US7298161B2Nov 20, 2007
Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability
IBM10 citations83
US6159787ADec 12, 2000
Structures and processes for reduced topography trench capacitors
IBM15 citations82
US7315075B2Jan 1, 2008
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
IBM8 citations74
US7064414B2Jun 20, 2006
Heater for annealing trapped charge in a semiconductor device
IBM10 citations74
US6088258AJul 11, 2000
Structures for reduced topography capacitors
IBM14 citations74
US7388274B2Jun 17, 2008
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
IBM4 citations63
US7023041B2Apr 4, 2006
Trench capacitor vertical structure
IBM6 citations63
US6333239B1Dec 25, 2001
Processes for reduced topography capacitors
IBM2 citations63
US7868640B2Jan 11, 2011
Array-based early threshold voltage recovery characterization measurement
IBM6 citations62
US7723200B2May 25, 2010
Electrically tunable resistor and related methods
IBM5 citations61
US7512506B2Mar 31, 2009
IC chip stress testing
IBM5 citations59
US7791169B2Sep 7, 2010
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
IBM0 citations52
US7511378B2Mar 31, 2009
Enhancement of performance of a conductive wire in a multilayered substrate
IBM0 citations51
US6891359B2May 10, 2005
Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability
IBM1 citations51
US8018017B2Sep 13, 2011
Thermo-mechanical cleavable structure
IBM1 citations49
US9404960B2Aug 2, 2016
On chip bias temperature instability characterization of a semiconductor device
IBM0 citations42