Inventor
TANIGUCHI YASUHIRO
JP64 patents
⚠️ This page may combine multiple inventors who share the name “TANIGUCHI YASUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FLOADIA CORP
16 patentsUS9318196B1Apr 19, 2016
Non-volatile semiconductor memory device
FLOADIA CORP22 citations92
US9502109B2Nov 22, 2016
Non-volatile semiconductor storage device
FLOADIA CORP7 citations84
US9437736B2Sep 6, 2016
Non-volatile semiconductor memory device
FLOADIA CORP8 citations84
US11282878B2Mar 22, 2022
Solid-state imaging device and camera system
FLOADIA CORP2 citations73
US11011530B2May 18, 2021
Memory cell, nonvolatile semiconductor storage device, and method for manufacturing nonvolatile semiconductor storage device
FLOADIA CORP2 citations73
US10680001B2Jun 9, 2020
Non-volatile semiconductor memory device
FLOADIA CORP2 citations72
US10102911B2Oct 16, 2018
Non-volatile semiconductor storage device for reducing the number of memory cells arranged along a control to which a memory gate voltage is applied
FLOADIA CORP3 citations72
US9842650B2Dec 12, 2017
Non-volatile SRAM memory cell, and non-volatile semiconductor storage device
FLOADIA CORP3 citations72
US10074660B2Sep 11, 2018
Semiconductor memory device
FLOADIA CORP3 citations71
US9343166B2May 17, 2016
Non-volatile semiconductor storage device
FLOADIA CORP2 citations63
US12598743B2Apr 7, 2026
Memory cell, nonvolatile semiconductor storage device, and method for manufacturing nonvolatile semiconductor storage device
FLOADIA CORP0 citations62
US10381446B2Aug 13, 2019
Memory cell and non-volatile semiconductor storage device
FLOADIA CORP1 citations62
US10276727B2Apr 30, 2019
Memory cell, semiconductor integrated circuit device, and method for manufacturing semiconductor integrated circuit device
FLOADIA CORP1 citations62
US11127469B2Sep 21, 2021
Nonvolatile semiconductor storage device
FLOADIA CORP0 citations52
US10615168B2Apr 7, 2020
Memory cell, semiconductor integrated circuit device, and method for manufacturing semiconductor integrated circuit device
FLOADIA CORP0 citations52
US10431589B2Oct 1, 2019
Memory cell, semiconductor integrated circuit device, and method for manufacturing semiconductor integrated circuit device
FLOADIA CORP0 citations52
HITACHI LTD
10 patentsUS6569742B1May 27, 2003
Method of manufacturing semiconductor integrated circuit device having silicide layers
HITACHI LTD125 citations99
US6376316B2Apr 23, 2002
Method for manufacturing semiconductor integrated circuit device having deposited layer for gate insulation
HITACHI LTD46 citations96
US6646313B2Nov 11, 2003
Semiconductor integrated circuit device and having deposited layer for gate insulation
HITACHI LTD23 citations93
US6576512B2Jun 10, 2003
Method of manufacturing an EEPROM device
HITACHI LTD16 citations93
US6559012B2May 6, 2003
Method for manufacturing semiconductor integrated circuit device having floating gate and deposited film
HITACHI LTD16 citations93
US6387744B2May 14, 2002
Process for manufacturing semiconductor integrated circuit device
HITACHI LTD23 citations93
US6211003B1Apr 3, 2001
Semiconductor integrated circuit device and process for manufacturing the same
HITACHI LTD33 citations93
US6617632B2Sep 9, 2003
Semiconductor device and a method of manufacturing the same
HITACHI LTD34 citations92
US6711061B2Mar 23, 2004
Non-volatile semiconductor memory device for selectively re-checking word lines
HITACHI LTD4 citations63
US6459619B1Oct 1, 2002
Non-volatile semiconductor memory device for selectively re-checking word lines
HITACHI LTD2 citations63
TOSHIBA KK
10 patentsUS7095432B2Aug 22, 2006
Image processing apparatus and method
TOSHIBA KK140 citations97
US6298143B1Oct 2, 2001
Moving target detecting system and moving target detecting method
TOSHIBA KK61 citations96
US5991428ANov 23, 1999
Moving object detection apparatus and method
TOSHIBA KK73 citations96
US6456730B1Sep 24, 2002
Moving object detection apparatus and method
TOSHIBA KK50 citations93
US6049875AApr 11, 2000
Security apparatus and method
TOSHIBA KK29 citations92
US7321839B2Jan 22, 2008
Method and apparatus for calibration of camera system, and method of manufacturing camera system
TOSHIBA KK9 citations84
US6373897B1Apr 16, 2002
Moving quantity detection apparatus and method
TOSHIBA KK15 citations84
US7844921B2Nov 30, 2010
Interface apparatus and interface method
TOSHIBA KK19 citations82
US7124046B2Oct 17, 2006
Method and apparatus for calibration of camera system, and method of manufacturing camera system
TOSHIBA KK7 citations74
USRE39550EApr 3, 2007
Security apparatus and method
TOSHIBA KK3 citations62
RENESAS TECH CORP
10 patentsUS7166893B2Jan 23, 2007
Semiconductor integrated circuit device
RENESAS TECH CORP24 citations93
US7119406B2Oct 10, 2006
Semiconductor integrated circuit device having deposited layer for gate insulation
RENESAS TECH CORP11 citations93
US7313026B2Dec 25, 2007
Semiconductor device
RENESAS TECH CORP22 citations92
US7601581B2Oct 13, 2009
Method of manufacturing a semiconductor device
RENESAS TECH CORP14 citations84
US7023062B2Apr 4, 2006
Semiconductor integrated circuit device having deposited layer for gate insulation
RENESAS TECH CORP9 citations82
US7268401B2Sep 11, 2007
Semiconductor integrated circuit device having deposited layer for gate insulation
RENESAS TECH CORP4 citations74
US6908837B2Jun 21, 2005
Method of manufacturing a semiconductor integrated circuit device including a gate electrode having a salicide layer thereon
RENESAS TECH CORP10 citations74
US7402873B2Jul 22, 2008
Semiconductor integrated circuit device having deposited layer for gate insulation
RENESAS TECH CORP2 citations63
US6842376B2Jan 11, 2005
Non-volatile semiconductor memory device for selectively re-checking word lines
RENESAS TECH CORP1 citations63
US7466599B2Dec 16, 2008
Semiconductor device
RENESAS TECH CORP3 citations62
YAMAKOSHI HIDEAKI
2 patentsRENESAS ELECTRONICS CORP
1 patentTANIGUCHI YASUHIRO
1 patentShowing the top 50 of 64 patents by PatentIndex Score.