Inventor

DETOFSKY ABRAM M

US15 patents

⚠️ This page may combine multiple inventors who share the name “DETOFSKY ABRAM M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

11 patents

US7233163B2Jun 19, 2007

Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit

INTEL CORP17 citations91

US7071723B2Jul 4, 2006

Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit

INTEL CORP19 citations91

US9869714B2Jan 16, 2018

Integrated circuit test temperature control mechanism

INTEL CORP9 citations83

US8926196B2Jan 6, 2015

Method and apparatus for an optical interconnect system

INTEL CORP13 citations83

US10677845B2Jun 9, 2020

Converged test platforms and processes for class and system testing of integrated circuits

INTEL CORP2 citations68

US9255945B2Feb 9, 2016

Micro positioning test socket and methods for active precision alignment and co-planarity feedback

INTEL CORP2 citations62

US12061230B2Aug 13, 2024

DETOFSKY ABRAM M

3 patents

US8710858B2Apr 29, 2014

Micro positioning test socket and methods for active precision alignment and co-planarity feedback

DETOFSKY ABRAM M7 citations82

US9059803B2Jun 16, 2015

Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths

DETOFSKY ABRAM M12 citations77

US9506980B2Nov 29, 2016

Integrated circuit testing architecture

DETOFSKY ABRAM M0 citations37

JOHNSON JOHN C

1 patent

US9400291B2Jul 26, 2016

Integrated circuit test temperature control mechanism

JOHNSON JOHN C15 citations83

DETOFSKY ABRAM M

INTEL CORP

Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit

Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit

Integrated circuit test temperature control mechanism

Method and apparatus for an optical interconnect system

Converged test platforms and processes for class and system testing of integrated circuits

Micro positioning test socket and methods for active precision alignment and co-planarity feedback

Active optical plug to optically or electrically test a photonics package

Systems and methods for wireless device testing

Stackable photonics die with direct optical interconnect

Package testing system and method with contact alignment

Increased processing efficiency for optical spectral analyzers

DETOFSKY ABRAM M

Micro positioning test socket and methods for active precision alignment and co-planarity feedback

Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths

Integrated circuit testing architecture

JOHNSON JOHN C

Integrated circuit test temperature control mechanism