Inventor

KAMBA SEIJI

JP24 patents

⚠️ This page may combine multiple inventors who share the name “KAMBA SEIJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KAMBA SEIJI

MURATA MANUFACTURING CO

Method of measuring characteristics of specimen, and flat-plate periodic structure

Extraction method, analytical method, extraction device, and analytical device

Dual-mode band-pass filter

Dual-mode band-pass filter

Void-arranged structure and measurement method using the same

Aperture array and production method therefor

Filtration filter

Perforated-structure body, manufacturing method therefor, and measurement apparatus and measurement method

Filter and filter device

Separation recovery system and separation recovery method

Aperture array structure and measurement method using the same

Measurement device and feature measurement method of object to be measured employing same

Measurement structure, method of manufacturing same, and measuring method using same

Dual-mode band-pass filter

Filtration filter

Filtration filter

Measurement method and measurement system

Specimen measuring method

Fixing instrument and metal mesh device

KAMBA SEIJI

Method of measuring characteristics of specimen and flat-plate periodic structure

Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring device

OGAWA YUICHI

Sample analysis method

TAKIGAWA KAZUHIRO

Method for measurement of properties of analyte

KONDO TAKASHI

Method and apparatus for measuring characteristics of object