Inventor
ZANATI ABDELLATIF
DE19 patents
⚠️ This page may combine multiple inventors who share the name “ZANATI ABDELLATIF”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NXP BV
17 patentsUS10097287B1Oct 9, 2018
RF radar device BIST using secondary modulation
NXP BV34 citations93
US11187783B2Nov 30, 2021
Radar systems and methods for operating radar systems
NXP BV8 citations81
US11215694B2Jan 4, 2022
Built-in self-test for a radar unit receiver and method therefor
NXP BV3 citations72
US10955528B2Mar 23, 2021
Built-in self-test radar unit and method for phase shift measurement therein
NXP BV5 citations72
US10901023B2Jan 26, 2021
Apparatuses and methods involving adjustable circuit-stress test conditions for stressing regional circuits
NXP BV2 citations72
US10272927B2Apr 30, 2019
Sensor data network
NXP BV6 citations68
US12074124B2Aug 27, 2024
Integrated circuit package with integrated waveguide launcher
NXP BV3 citations67
US11749624B2Sep 5, 2023
Semiconductor device and method
NXP BV0 citations62
US10670699B2Jun 2, 2020
RF radar device BIST using noise injection
NXP BV1 citations62
US11664567B2May 30, 2023
Hollow waveguide assembly formed by affixing first and second substrates to form a cavity therein and having a conductive layer covering the cavity
NXP BV1 citations60
US11079429B2Aug 3, 2021
ATE testing system and method for millimetre wave packaged integrated circuits
NXP BV1 citations58
US10325508B2Jun 18, 2019
Apparatus and associated methods for collision avoidance
NXP BV1 citations55
US12548877B2Feb 10, 2026
Printed circuit board (PCB) including a vertical launcher having a signal via for radiating signal energy through a PCB channel region
NXP BV0 citations49
US11415626B2Aug 16, 2022
Method and apparatus comprising a semiconductor device and test apparatus
NXP BV0 citations49
US12451578B2Oct 21, 2025
Interposers with millimeter-wave coaxial-to-waveguide transistions
NXP BV0 citations44
US12451579B2Oct 21, 2025
Interposers with millimeter-wave transitions
NXP BV0 citations44
US11635461B2Apr 25, 2023
Test apparatus and method for testing a semiconductor device
NXP BV0 citations44