P

Inventor

ZANATI ABDELLATIF

DE19 patents
⚠️ This page may combine multiple inventors who share the name “ZANATI ABDELLATIF”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NXP BV

17 patents
US10097287B1Oct 9, 2018

RF radar device BIST using secondary modulation

NXP BV34 citations93
US11187783B2Nov 30, 2021

Radar systems and methods for operating radar systems

NXP BV8 citations81
US11215694B2Jan 4, 2022

Built-in self-test for a radar unit receiver and method therefor

NXP BV3 citations72
US10955528B2Mar 23, 2021

Built-in self-test radar unit and method for phase shift measurement therein

NXP BV5 citations72
US10901023B2Jan 26, 2021

Apparatuses and methods involving adjustable circuit-stress test conditions for stressing regional circuits

NXP BV2 citations72
US10272927B2Apr 30, 2019

Sensor data network

NXP BV6 citations68
US12074124B2Aug 27, 2024

Integrated circuit package with integrated waveguide launcher

NXP BV3 citations67
US11749624B2Sep 5, 2023

Semiconductor device and method

NXP BV0 citations62
US10670699B2Jun 2, 2020

RF radar device BIST using noise injection

NXP BV1 citations62
US11664567B2May 30, 2023

Hollow waveguide assembly formed by affixing first and second substrates to form a cavity therein and having a conductive layer covering the cavity

NXP BV1 citations60
US11079429B2Aug 3, 2021

ATE testing system and method for millimetre wave packaged integrated circuits

NXP BV1 citations58
US10325508B2Jun 18, 2019

Apparatus and associated methods for collision avoidance

NXP BV1 citations55
US12548877B2Feb 10, 2026

Printed circuit board (PCB) including a vertical launcher having a signal via for radiating signal energy through a PCB channel region

NXP BV0 citations49
US11415626B2Aug 16, 2022

Method and apparatus comprising a semiconductor device and test apparatus

NXP BV0 citations49
US12451578B2Oct 21, 2025

Interposers with millimeter-wave coaxial-to-waveguide transistions

NXP BV0 citations44
US12451579B2Oct 21, 2025

Interposers with millimeter-wave transitions

NXP BV0 citations44
US11635461B2Apr 25, 2023

Test apparatus and method for testing a semiconductor device

NXP BV0 citations44

SIEMENS AG

1 patent

ZANATI ABDELLATIF

1 patent