P

Inventor

RUBIN JOSHUA M

US75 patents

Patents

50 patents
US10607938B1Mar 31, 2020

Power distribution networks for monolithic three-dimensional semiconductor integrated circuit devices

IBM50 citations98
US10103065B1Oct 16, 2018

Gate metal patterning for tight pitch applications

IBM50 citations98
US9954058B1Apr 24, 2018

Self-aligned air gap spacer for nanosheet CMOS devices

IBM79 citations98
US11164817B2Nov 2, 2021

Multi-chip package structures with discrete redistribution layers

IBM32 citations94
US11101318B2Aug 24, 2021

Back-side memory element with local memory select transistor

IBM14 citations94
US11094637B2Aug 17, 2021

Multi-chip package structures having embedded chip interconnect bridges and fan-out redistribution layers

IBM17 citations94
US10243043B2Mar 26, 2019

Self-aligned air gap spacer for nanosheet CMOS devices

IBM16 citations94
US9711501B1Jul 18, 2017

Interlayer via

IBM34 citations94
US10748901B2Aug 18, 2020

Interlayer via contacts for monolithic three-dimensional semiconductor integrated circuit devices

IBM11 citations86
US10692768B1Jun 23, 2020

Vertical transport field-effect transistor architecture

IBM13 citations86
US10636791B1Apr 28, 2020

Vertical field-effect transistors for monolithic three-dimensional semiconductor integrated circuit devices

IBM5 citations84
US10593681B1Mar 17, 2020

Three-dimensional monolithic vertical transistor memory cell with unified inter-tier cross-couple

IBM9 citations84
US10483344B1Nov 19, 2019

Fabrication of a MIM capacitor structure with via etch control with integrated maskless etch tuning layers

IBM8 citations84
US10461148B1Oct 29, 2019

Multilayer buried metal-insultor-metal capacitor structures

IBM10 citations84
US10446606B2Oct 15, 2019

Back-side memory element with local memory select transistor

IBM13 citations84
US9786546B1Oct 10, 2017

Bulk to silicon on insulator device

IBM7 citations84
US9761498B2Sep 12, 2017

Selective oxidation of buried silicon-germanium to form tensile strained silicon FinFETs

IBM6 citations84
US9735062B1Aug 15, 2017

Defect reduction in channel silicon germanium on patterned silicon

IBM9 citations84
US9634113B2Apr 25, 2017

Fully silicided linerless middle-of-line (MOL) contact

IBM7 citations84
US9570590B1Feb 14, 2017

Selective oxidation of buried silicon-germanium to form tensile strained silicon FinFETs

IBM6 citations84
US10714420B1Jul 14, 2020

High cutoff frequency metal-insulator-metal capacitors implemented using via contact configurations

IBM7 citations82
US11574875B2Feb 7, 2023

Multi-chip package structures having embedded chip interconnect bridges and fan-out redistribution layers

IBM2 citations73
US11164791B2Nov 2, 2021

Contact formation for stacked vertical transport field-effect transistors

IBM3 citations73
US11133259B2Sep 28, 2021

Multi-chip package structure having high density chip interconnect bridge with embedded power distribution network

IBM4 citations73
US11069679B2Jul 20, 2021

Reducing gate resistance in stacked vertical transport field effect transistors

IBM4 citations73
US11049844B2Jun 29, 2021

Semiconductor wafer having trenches with varied dimensions for multi-chip modules

IBM3 citations73
US10910312B2Feb 2, 2021

Power distribution networks for monolithic three-dimensional semiconductor integrated circuit devices

IBM2 citations73
US10903165B2Jan 26, 2021

Power distribution networks for monolithic three-dimensional semiconductor integrated circuit devices

IBM2 citations73
US10833081B2Nov 10, 2020

Forming isolated contacts in a stacked vertical transport field effect transistor (VTFET)

IBM2 citations73
US10770460B2Sep 8, 2020

Vertical field-effect transistors for monolithic three-dimensional semiconductor integrated circuit devices

IBM2 citations73
US10755985B2Aug 25, 2020

Gate metal patterning for tight pitch applications

IBM4 citations73
US10700067B2Jun 30, 2020

Vertical field-effect transistors for monolithic three-dimensional semiconductor integrated circuit devices

IBM3 citations73
US10600694B2Mar 24, 2020

Gate metal patterning for tight pitch applications

IBM4 citations73
US10121877B1Nov 6, 2018

Vertical field effect transistor with metallic bottom region

IBM3 citations73
US9997607B2Jun 12, 2018

Mirrored contact CMOS with self-aligned source, drain, and back-gate

IBM2 citations73
US9978871B2May 22, 2018

Bulk to silicon on insulator device

IBM2 citations73
US9881925B2Jan 30, 2018

Mirror contact capacitor

IBM2 citations73
US9853151B2Dec 26, 2017

Fully silicided linerless middle-of-line (MOL) contact

IBM3 citations73
US9627410B2Apr 18, 2017

Metallized junction FinFET structures

IBM3 citations73
US10991635B2Apr 27, 2021

Multiple chip bridge connector

IBM2 citations72
US9812571B2Nov 7, 2017

Tensile strained high percentage silicon germanium alloy FinFETs

IBM3 citations71
US12364004B2Jul 15, 2025

Dummy fin contact in vertically stacked transistors

IBM0 citations63
US12167612B2Dec 10, 2024

Back-side memory element with local memory select transistor

IBM0 citations63
US11855191B2Dec 26, 2023

Vertical FET with contact to gate above active fin

IBM0 citations63
US11756957B2Sep 12, 2023

Reducing gate resistance in stacked vertical transport field effect transistors

IBM0 citations63
US11563003B2Jan 24, 2023

Fin top hard mask formation after wafer flipping process

IBM1 citations63
US10971504B2Apr 6, 2021

Three-dimensional monolithic vertical transistor memory cell with unified inter-tier cross-couple

IBM1 citations63
US10903307B2Jan 26, 2021

Fabrication of a MIM capacitor structure with via etch control with integrated maskless etch tuning layers

IBM1 citations63
US10147815B2Dec 4, 2018

Fully silicided linerless middle-of-line (MOL) contact

IBM1 citations63
US9991339B2Jun 5, 2018

Bulk to silicon on insulator device

IBM1 citations63

Showing the top 50 of 75 patents by PatentIndex Score.