Inventor
HSIEH HUNG-CHIH
TW29 patents
⚠️ This page may combine multiple inventors who share the name “HSIEH HUNG-CHIH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SHENZHEN EPOSTAR ELECTRONICS LTD CO
15 patentsUS10339046B1Jul 2, 2019
Data moving method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO16 citations85
US10642731B2May 5, 2020
Memory management method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO3 citations73
US10635358B2Apr 28, 2020
Memory management method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO4 citations73
US11288019B2Mar 29, 2022
Memory management method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO4 citations71
US10503606B2Dec 10, 2019
Data backup method, data recovery method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO3 citations71
US10339045B2Jul 2, 2019
Valid data management method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO3 citations71
US10120615B2Nov 6, 2018
Memory management method and storage controller using the same
SHENZHEN EPOSTAR ELECTRONICS LTD CO3 citations71
US10635356B2Apr 28, 2020
Data management method and storage controller using the same
SHENZHEN EPOSTAR ELECTRONICS LTD CO2 citations69
US10579306B1Mar 3, 2020
Memory management method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO1 citations58
US10635583B2Apr 28, 2020
Memory management method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO0 citations41
US10817416B2Oct 27, 2020
Memory management method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO0 citations40
US10860247B2Dec 8, 2020
Data writing method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO0 citations39
US10782919B2Sep 22, 2020
Command processing method and storage controller using the same
SHENZHEN EPOSTAR ELECTRONICS LTD CO0 citations37
US10430288B2Oct 1, 2019
Data backup method, data recovery method and storage controller
SHENZHEN EPOSTAR ELECTRONICS LTD CO0 citations37
US10372379B2Aug 6, 2019
Command processing method and storage controller using the same
SHENZHEN EPOSTAR ELECTRONICS LTD CO0 citations37
TAIWAN SEMICONDUCTOR MFG CO LTD
12 patentsUS10990023B1Apr 27, 2021
Method and apparatus for diffraction-based overlay measurement
TAIWAN SEMICONDUCTOR MFG CO LTD22 citations94
US11841622B2Dec 12, 2023
Method and apparatus for diffraction-based overlay measurement
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11294293B2Apr 5, 2022
Overlay marks for reducing effect of bottom layer asymmetry
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11275314B2Mar 15, 2022
Method and apparatus for diffraction-based overlay measurement
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10983005B2Apr 20, 2021
Spectroscopic overlay metrology
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations73
US11852981B2Dec 26, 2023
Frequency-picked methodology for diffraction based overlay measurement
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations68
US10969697B1Apr 6, 2021
Overlay metrology tool and methods of performing overlay measurements
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations65
US12554206B2Feb 17, 2026
Overlay marks for reducing effect of bottom layer asymmetry
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11726413B2Aug 15, 2023
Overlay marks for reducing effect of bottom layer asymmetry
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11656391B2May 23, 2023
Aperture design and methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10663633B2May 26, 2020
Aperture design and methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12216412B2Feb 4, 2025
Frequency-picked methodology for diffraction-based overlay measurement
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations45