Inventor
SHIMURA KEI
JP40 patents
⚠️ This page may combine multiple inventors who share the name “SHIMURA KEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
22 patentsUS7672799B2Mar 2, 2010
Defect inspection apparatus and defect inspection method
HITACHI HIGH TECH CORP11 citations83
US9976966B2May 22, 2018
Defect inspection method and its device
HITACHI HIGH TECH CORP3 citations73
US9513228B2Dec 6, 2016
Defect inspection method and its device
HITACHI HIGH TECH CORP3 citations73
US8921798B2Dec 30, 2014
Defect inspection apparatus and defect inspection method
HITACHI HIGH TECH CORP4 citations73
US11079275B2Aug 3, 2021
Far-infrared spectroscopy device
HITACHI HIGH TECH CORP4 citations71
US10948347B2Mar 16, 2021
Far-infrared spectroscopy device
HITACHI HIGH TECH CORP1 citations71
US11016023B1May 25, 2021
Far-infrared spectroscopic device and far-infrared spectroscopic method
HITACHI HIGH TECH CORP2 citations70
US7746453B2Jun 29, 2010
Pattern defect inspection apparatus and method
HITACHI HIGH TECH CORP4 citations63
US7706598B2Apr 27, 2010
Method and apparatus for visual inspection
HITACHI HIGH TECH CORP5 citations63
US11320309B2May 3, 2022
Far-infrared spectroscopy device
HITACHI HIGH TECH CORP0 citations61
US7953567B2May 31, 2011
Defect inspection apparatus and defect inspection method
HITACHI HIGH TECH CORP2 citations61
US12196670B2Jan 14, 2025
Far-infrared spectroscopy device
HITACHI HIGH TECH CORP0 citations56
US10613026B2Apr 7, 2020
Far-infrared imaging device and far-infrared imaging method
HITACHI HIGH TECH CORP0 citations52
US10203278B2Feb 12, 2019
Far-infrared imaging device and far-infrared imaging method
HITACHI HIGH TECH CORP0 citations52
US10113959B2Oct 30, 2018
Terahertz wave generating device and spectroscopic device using same
HITACHI HIGH TECH CORP1 citations52
US9194795B2Nov 24, 2015
Defect inspection apparatus and defect inspection method
HITACHI HIGH TECH CORP0 citations52
US9151719B2Oct 6, 2015
Inspection apparatus
HITACHI HIGH TECH CORP0 citations52
US11977026B2May 7, 2024
Far-infrared spectroscopy device and far-infrared spectroscopy method
HITACHI HIGH TECH CORP0 citations49
US11644418B2May 9, 2023
Far-infrared light source and far-infrared spectrometer
HITACHI HIGH TECH CORP0 citations49
US8351683B2Jan 8, 2013
Inspection apparatus and inspection method
HITACHI HIGH TECH CORP1 citations48
US12535412B2Jan 27, 2026
Far-infrared spectroscopy device and sample adapter
HITACHI HIGH TECH CORP0 citations46
US7821644B2Oct 26, 2010
Apparatus for visual inspection
HITACHI HIGH TECH CORP0 citations41
SHIMURA KEI
6 patentsUS8131058B2Mar 6, 2012
Method and apparatus for visual inspection
SHIMURA KEI11 citations83
US8126259B2Feb 28, 2012
Method and apparatus for visual inspection
SHIMURA KEI12 citations83
US9851548B2Dec 26, 2017
Optical microscope device and testing apparatus comprising same
SHIMURA KEI2 citations67
US8879821B2Nov 4, 2014
Defect inspecting device and defect inspecting method
SHIMURA KEI2 citations62
US8472697B2Jun 25, 2013
Method and apparatus for visual inspection
SHIMURA KEI2 citations62
US8194969B2Jun 5, 2012
Method and apparatus for visual inspection
SHIMURA KEI2 citations62
TOSHIBA KK
5 patentsUS6421451B2Jul 16, 2002
Step difference detection apparatus and processing apparatus using the same
TOSHIBA KK55 citations96
US6095656AAug 1, 2000
Backlighting apparatus and display apparatus using the same
TOSHIBA KK26 citations92
US5475210ADec 12, 1995
Noise reduction system for optical record and reproduction apparatus using auto-power controlled semiconductor laser device
TOSHIBA KK39 citations92
US5949569ASep 7, 1999
Projection display apparatus and spatial light modulation device applied to the same
TOSHIBA KK18 citations84
US5250796AOct 5, 1993
Noise reduction system for optical record and reproduction apparatus using auto-power controlled semiconductor laser device
TOSHIBA KK13 citations74