Inventor

ASANO HIDEMITSU

JP18 patents

⚠️ This page may combine multiple inventors who share the name “ASANO HIDEMITSU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASANO HIDEMITSU

MITUTOYO CORP

Method and device for controlling rotary table

X-ray CT measuring apparatus and interference prevention method thereof

Surface texture measuring apparatus

Measuring X-ray CT apparatus and tomographic image generating method

Illumination light quantity setting method in image measuring instrument

Method and apparatus for generating measurement plan for measuring X-ray CT

Measuring method, measuring system and storage medium

Calibration method and apparatus for measurement X-ray CT apparatus, measurement method and apparatus using the same, and measurement X-ray CT apparatus

Measuring X-ray CT apparatus and production work piece measurement method

Dimensional X-ray computed tomography system and CT reconstruction method using same

Object-forming machine, cross-section measurement apparatus, and cross-section measurement method

Object-forming machine, cross-section measurement apparatus, and cross-section measurement method

Measurement X-ray CT apparatus

Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program

NAGAHAMA TATSUYA

Light-interference measuring apparatus

MATSUMIYA SADAYUKI

Coordinate measuring machine

GOTO TOMONORI

Shape measuring method and shape measuring apparatus

ASANO HIDEMITSU

Slit width adjusting device and microscope laser processing apparatus