Inventor
PINTO GUSTAVO A
US15 patents
⚠️ This page may combine multiple inventors who share the name “PINTO GUSTAVO A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR
5 patentsUS6633174B1Oct 14, 2003
Stepper type test structures and methods for inspection of semiconductor integrated circuits
KLA TENCOR195 citations99
US7655482B2Feb 2, 2010
Chemical mechanical polishing test structures and methods for inspecting the same
KLA TENCOR91 citations97
US7179661B1Feb 20, 2007
Chemical mechanical polishing test structures and methods for inspecting the same
KLA TENCOR68 citations97
US6566885B1May 20, 2003
Multiple directional scans of test structures on semiconductor integrated circuits
KLA TENCOR57 citations96
US6528818B1Mar 4, 2003
Test structures and methods for inspection of semiconductor integrated circuits
KLA TENCOR60 citations96
KLA TENCOR CORP
4 patentsUS6433561B1Aug 13, 2002
Methods and apparatus for optimizing semiconductor inspection tools
KLA TENCOR CORP159 citations98
US6576923B2Jun 10, 2003
Inspectable buried test structures and methods for inspecting the same
KLA TENCOR CORP117 citations97
US6509197B1Jan 21, 2003
Inspectable buried test structures and methods for inspecting the same
KLA TENCOR CORP146 citations97
US6445199B1Sep 3, 2002
Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures
KLA TENCOR CORP106 citations97
KLA TENCOR TECH CORP
4 patentsUS7656170B2Feb 2, 2010
Multiple directional scans of test structures on semiconductor integrated circuits
KLA TENCOR TECH CORP96 citations96
US6921672B2Jul 26, 2005
Test structures and methods for inspection of semiconductor integrated circuits
KLA TENCOR TECH CORP59 citations96
US7012439B2Mar 14, 2006
Multiple directional scans of test structures on semiconductor integrated circuits
KLA TENCOR TECH CORP21 citations92
US6977791B2Dec 20, 2005
Media servowriting system
KLA TENCOR TECH CORP42 citations88