Inventor
LIU JONATHAN H
US19 patents
Patents
19 patentsUS7205854B2Apr 17, 2007
On-chip transistor degradation monitoring
INTEL CORP77 citations98
US7531836B2May 12, 2009
Body bias compensation for aged transistors
INTEL CORP114 citations96
US5964880AOct 12, 1999
Circuit interface synchronization using slave variable delay loop
INTEL CORP68 citations96
US6298450B1Oct 2, 2001
Detecting states of signals
INTEL CORP48 citations95
US6175928B1Jan 16, 2001
Reducing timing variance of signals from an electronic device
INTEL CORP37 citations95
US6832325B2Dec 14, 2004
Device on a source synchronous bus sending data in quadrature phase relationship and receiving data in phase with the bus clock signal
INTEL CORP41 citations92
US6725390B1Apr 20, 2004
Method and an apparatus for adjusting clock signal to sample data
INTEL CORP20 citations92
US6580305B1Jun 17, 2003
Generating a clock signal
INTEL CORP36 citations92
US6525607B1Feb 25, 2003
High-voltage differential input receiver
INTEL CORP21 citations92
US6172546B1Jan 9, 2001
Method and apparatus to monitor a characteristic associated with an electronic device
INTEL CORP22 citations92
US7338817B2Mar 4, 2008
Body bias compensation for aged transistors
INTEL CORP17 citations91
US6842027B2Jan 11, 2005
Method and apparatus for detection and quantification of on-die voltage noise in microcircuits
INTEL CORP29 citations91
US7471161B2Dec 30, 2008
Signal degradation monitoring
INTEL CORP14 citations84
US6108758AAug 22, 2000
Multiple masters in a memory control system
INTEL CORP17 citations84
US7138816B2Nov 21, 2006
On-die monitoring device power grid
INTEL CORP10 citations74
US7334148B2Feb 19, 2008
Optimization of integrated circuit device I/O bus timing
INTEL CORP7 citations73
US6631338B2Oct 7, 2003
Dynamic current calibrated driver circuit
INTEL CORP10 citations72
US7038480B2May 2, 2006
Method for detection and quantification of on-die voltage noise in microcircuits
INTEL CORP4 citations61
US6947859B2Sep 20, 2005
Dynamic current calibrated driver circuit
INTEL CORP1 citations50