Inventor
KOJIMA SHOJI
JP51 patents
⚠️ This page may combine multiple inventors who share the name “KOJIMA SHOJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
19 patentsUS6294949B1Sep 25, 2001
Voltage drive circuit, voltage drive apparatus and semiconductor-device testing apparatus
ADVANTEST CORP23 citations92
US8030965B2Oct 4, 2011
Level shifter using SR-flip flop
ADVANTEST CORP7 citations84
US7852119B1Dec 14, 2010
SR-flip flop with level shift function
ADVANTEST CORP11 citations84
US7830191B2Nov 9, 2010
Vernier delay circuit
ADVANTEST CORP16 citations84
US7642797B2Jan 5, 2010
Power supply stabilizing circuit, an electronic device and a test apparatus
ADVANTEST CORP11 citations84
US7397289B2Jul 8, 2008
Skew adjusting method, skew adjusting apparatus, and test apparatus
ADVANTEST CORP13 citations84
US7373574B2May 13, 2008
Semiconductor testing apparatus and method of testing semiconductor
ADVANTEST CORP11 citations84
US7843374B2Nov 30, 2010
Priority encoder
ADVANTEST CORP7 citations74
US7012444B2Mar 14, 2006
Semiconductor tester
ADVANTEST CORP7 citations74
US7990183B2Aug 2, 2011
Differential comparator with skew compensation function and test apparatus using the same
ADVANTEST CORP2 citations63
US7772892B2Aug 10, 2010
Differential hybrid circuit
ADVANTEST CORP4 citations63
US6505315B1Jan 7, 2003
Semiconductor device testing apparatus and signal output apparatus for outputting a differential signal to a test semiconductor device
ADVANTEST CORP6 citations63
US12085613B2Sep 10, 2024
Systems and methods for storing calibration data of a test system for testing a device under test
ADVANTEST CORP0 citations62
US7834607B2Nov 16, 2010
Voltage generator with current limiting and semiconductor testing device
ADVANTEST CORP1 citations52
US7518405B2Apr 14, 2009
Impedance matching circuit, input-output circuit and semiconductor test apparatus
ADVANTEST CORP1 citations52
US7317336B2Jan 8, 2008
Impedance matching circuit, input-output circuit and semiconductor test apparatus
ADVANTEST CORP1 citations52
US7952359B2May 31, 2011
Test apparatus having bidirectional differential interface
ADVANTEST CORP0 citations42
US7576571B2Aug 18, 2009
Potential comparator and test apparatus
ADVANTEST CORP0 citations42
US9977337B2May 22, 2018
Exposure apparatus and exposure method
ADVANTEST CORP0 citations40
KOJIMA SHOJI
18 patentsUS8183893B2May 22, 2012
Driver comparator circuit
KOJIMA SHOJI8 citations84
US8280159B2Oct 2, 2012
Methods and devices for compressing an image
KOJIMA SHOJI11 citations81
US8575961B2Nov 5, 2013
Multi-valued driver circuit
KOJIMA SHOJI5 citations73
US8502549B2Aug 6, 2013
Test apparatus and driver circuit
KOJIMA SHOJI2 citations63
US8466701B2Jun 18, 2013
Power supply stabilizing circuit, electronic device and test apparatus
KOJIMA SHOJI4 citations63
US8319569B2Nov 27, 2012
Quadrature amplitude modulator and quadrature amplitude modulation method
KOJIMA SHOJI5 citations63
US8254435B2Aug 28, 2012
Modulation method and modulator using pulse edge shift
KOJIMA SHOJI2 citations63
US8247925B2Aug 21, 2012
Power source stabilization circuit, electronic device and testing apparatus
KOJIMA SHOJI2 citations63
US8218704B2Jul 10, 2012
Demodulation method and demodulator of pulse-edge shifted pulse
KOJIMA SHOJI2 citations63
US8093907B2Jan 10, 2012
Test equipment
KOJIMA SHOJI2 citations63
US8065102B2Nov 22, 2011
Pulse width measurement circuit
KOJIMA SHOJI2 citations63
US8504320B2Aug 6, 2013
Differential SR flip-flop
KOJIMA SHOJI1 citations52
US8497722B2Jul 30, 2013
SR flip-flop
KOJIMA SHOJI1 citations52
US8704527B2Apr 22, 2014
Comparison judgment circuit
KOJIMA SHOJI0 citations42
US8320440B2Nov 27, 2012
Equalizer circuit
KOJIMA SHOJI0 citations42
US8195411B2Jun 5, 2012
IDDQ test apparatus and test method
KOJIMA SHOJI0 citations42
US8129857B2Mar 6, 2012
Semiconductor circuit
KOJIMA SHOJI0 citations42
US8063682B2Nov 22, 2011
Semiconductor circuit for performing signal processing
KOJIMA SHOJI0 citations42
SEIKO EPSON CORP
9 patentsUS7050194B1May 23, 2006
Image processing apparatus, method of processing images, and printing apparatus to which image processing method is applied
SEIKO EPSON CORP35 citations92
US6906821B1Jun 14, 2005
Printing control method, printing control apparatus for producing/transmitting print command, computer program of printing control, and recording medium for recording computer program
SEIKO EPSON CORP19 citations86
US7532350B2May 12, 2009
Printing method and printing apparatus
SEIKO EPSON CORP10 citations84
US7646517B2Jan 12, 2010
Image processing system and image processing method
SEIKO EPSON CORP9 citations83
US7495793B2Feb 24, 2009
Image processing method, image processing apparatus, and print apparatus that uses image data recorded on an image record medium
SEIKO EPSON CORP17 citations83
US8023145B2Sep 20, 2011
Image processing system and image processing method
SEIKO EPSON CORP3 citations62
US7720293B2May 18, 2010
Image processing apparatus, printing apparatus and image processing method
SEIKO EPSON CORP3 citations62
US7333222B2Feb 19, 2008
Methods for creating printing data and for transferring printing data
SEIKO EPSON CORP4 citations61
US7330284B2Feb 12, 2008
Methods for creating printing data and for transferring printing data
SEIKO EPSON CORP2 citations61
FUJI HEAVY IND LTD
1 patentARAI YASUYUKI
1 patentSAWADA KEN ICHI
1 patentATAKA TSUYOSHI
1 patentShowing the top 50 of 51 patents by PatentIndex Score.